Adam WEISS

Person

Toronto, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Optical inspection of flat media using direct image technology
- Patent number 8,040,502
- Issue date Oct 18, 2011
- WDI Wise Device Inc.
- David P. Thomas
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the auto-focussing infinity corrected micr...
- Patent number 7,700,903
- Issue date Apr 20, 2010
- WDI Wise Device Inc.
- Adam Weiss
- G02 - OPTICS
Information Patent Grant
Method and apparatus for flat patterned media inspection
- Patent number 7,386,161
- Issue date Jun 10, 2008
- Photon Dynamics, Inc.
- Adam Weiss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tracking auto focus system
- Patent number 7,301,133
- Issue date Nov 27, 2007
- Photon Dynamics, Inc.
- Adam Weiss
- G02 - OPTICS
Information Patent Grant
Method and apparatus for high-throughput inspection of large flat p...
- Patent number 7,180,084
- Issue date Feb 20, 2007
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Grant
High precision gas bearing split-axis stage for transport and const...
- Patent number 7,137,309
- Issue date Nov 21, 2006
- Photon Dynamics, Inc.
- Adam Weiss
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Inspection of TFT LCD panels using on-demand automated optical insp...
- Patent number 7,084,970
- Issue date Aug 1, 2006
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Grant
High precision gas bearing split-axis stage for transport and const...
- Patent number 7,077,019
- Issue date Jul 18, 2006
- Photon Dynamics, Inc.
- Adam Weiss
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method and apparatus for high-throughput inspection of large flat p...
- Patent number 7,041,998
- Issue date May 9, 2006
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Sample introduction device for mass spectrometry using a fast fluid...
- Patent number 6,841,774
- Issue date Jan 11, 2005
- MDS Inc.
- Adam Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dark view inspection system for transparent media
- Patent number 6,633,377
- Issue date Oct 14, 2003
- Image Processing Systems Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Stereo vision inspection system for transparent media
- Patent number 6,512,239
- Issue date Jan 28, 2003
- Photon Dynamics Canada Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for edges of glass
- Patent number 6,501,546
- Issue date Dec 31, 2002
- Photon Dynamics Canada Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Glass inspection system including bright field and dark field illum...
- Patent number 6,437,357
- Issue date Aug 20, 2002
- Photon Dynamics Canada Inc.
- Adam Weiss
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR AUTOFOCUSSING AN OPTICAL MICROSCOPE AND DY...
- Publication number 20200355900
- Publication date Nov 12, 2020
- WDI Wise Device Inc.
- Adam WEISS
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SMALL AND LARGE FORMAT HISTOLOGY SAMPLE EX...
- Publication number 20160062101
- Publication date Mar 3, 2016
- WDI WISE DEVICE INC.
- Adam WEISS
- G02 - OPTICS
Information Patent Application
Optical Inspection Of Flat Media Using Direct Image Technology
- Publication number 20080062422
- Publication date Mar 13, 2008
- DE. VICE SCIENTIFIC INCORPORATED
- David P. Thomas
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR THE AUTO-FOCUSSING INFINITY CORRECTED MICR...
- Publication number 20080002252
- Publication date Jan 3, 2008
- Wegu-Device Inc.
- Adam WEISS
- G02 - OPTICS
Information Patent Application
Tracking auto focus system
- Publication number 20060202103
- Publication date Sep 14, 2006
- Photon Dynamics, Inc.
- Adam Weiss
- G02 - OPTICS
Information Patent Application
Method and apparatus for high-throughput inspection of large flat p...
- Publication number 20060186361
- Publication date Aug 24, 2006
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Application
High precision gas bearing split-axis stage for transport and const...
- Publication number 20060096395
- Publication date May 11, 2006
- Photon Dynamics, Inc.
- Adam Weiss
- G02 - OPTICS
Information Patent Application
Inspection of TFT LCD panels using on-demand automated optical insp...
- Publication number 20050254045
- Publication date Nov 17, 2005
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Application
High precision gas bearing split-axis stage for transport and const...
- Publication number 20050040338
- Publication date Feb 24, 2005
- Photon Dynamics, Inc.
- Adam Weiss
- G02 - OPTICS
Information Patent Application
Method and apparatus for high-throughput inspection of large flat p...
- Publication number 20040188643
- Publication date Sep 30, 2004
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for flat patterned media inspection
- Publication number 20040109598
- Publication date Jun 10, 2004
- Photon Dynamics, Inc.
- Adam Weiss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for flat patterned media inspection
- Publication number 20040086166
- Publication date May 6, 2004
- Photon Dynamics, Inc.
- Adam Weiss
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Optical inspection of flat media using direct image technology

Method and apparatus for the auto-focussing infinity corrected micr...

Method and apparatus for flat patterned media inspection

Tracking auto focus system

Method and apparatus for high-throughput inspection of large flat p...

High precision gas bearing split-axis stage for transport and const...

Inspection of TFT LCD panels using on-demand automated optical insp...

High precision gas bearing split-axis stage for transport and const...

Method and apparatus for high-throughput inspection of large flat p...

Sample introduction device for mass spectrometry using a fast fluid...

Dark view inspection system for transparent media

Stereo vision inspection system for transparent media

Inspection system for edges of glass

Glass inspection system including bright field and dark field illum...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR AUTOFOCUSSING AN OPTICAL MICROSCOPE AND DY...

METHOD AND APPARATUS FOR SMALL AND LARGE FORMAT HISTOLOGY SAMPLE EX...

Optical Inspection Of Flat Media Using Direct Image Technology

METHOD AND APPARATUS FOR THE AUTO-FOCUSSING INFINITY CORRECTED MICR...

Tracking auto focus system

Method and apparatus for high-throughput inspection of large flat p...

High precision gas bearing split-axis stage for transport and const...

Inspection of TFT LCD panels using on-demand automated optical insp...

High precision gas bearing split-axis stage for transport and const...

Method and apparatus for high-throughput inspection of large flat p...

Method and apparatus for flat patterned media inspection

Method and apparatus for flat patterned media inspection