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Aditya Jagirdar
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Scan warmup scheme for mitigating di/dt during scan test
Patent number
9,291,676
Issue date
Mar 22, 2016
Advanced Micro Devices, Inc.
Atchyuth K Gorti
G01 - MEASURING TESTING
Information
Patent Grant
Scan-based reset
Patent number
9,009,552
Issue date
Apr 14, 2015
Advanced Micro Devices, Inc.
Bill K. Kwan
G01 - MEASURING TESTING
Information
Patent Grant
Configurable Mux-D scan flip-flop design
Patent number
8,694,842
Issue date
Apr 8, 2014
Advanced Micro Devices, Inc.
Atchyuth K. Gorti
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Scan Warmup Scheme for Mitigating DI/DT During Scan Test
Publication number
20140237312
Publication date
Aug 21, 2014
Advanced Micro Devices, Inc.
Atchyuth K. Gorti
G01 - MEASURING TESTING
Information
Patent Application
CONFIGURABLE MUX-D SCAN FLIP-FLOP DESIGN
Publication number
20120124434
Publication date
May 17, 2012
Atchyuth K. Gorti
G01 - MEASURING TESTING
Information
Patent Application
SCAN-BASED RESET
Publication number
20120062283
Publication date
Mar 15, 2012
Bill K. Kwan
G01 - MEASURING TESTING