Adriaan Johan VAN LEEST

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus to determine a patterning process parameter us...
- Patent number 12,142,535
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus to determine a patterning process parameter
- Patent number 11,784,098
- Issue date Oct 10, 2023
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus to determine a patterning process parameter
- Patent number 11,728,224
- Issue date Aug 15, 2023
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus to determine a patterning process parameter
- Patent number 11,710,668
- Issue date Jul 25, 2023
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus to determine a patterning process parameter
- Patent number 11,145,557
- Issue date Oct 12, 2021
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to determine a patterning process parameter
- Patent number 11,101,185
- Issue date Aug 24, 2021
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus to determine a patterning process parameter
- Patent number 11,101,184
- Issue date Aug 24, 2021
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring a parameter of a lithographic pr...
- Patent number 11,092,900
- Issue date Aug 17, 2021
- ASML Netherlands B.V.
- Maurits Van Der Schaar
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to determine a patterning process parameter
- Patent number 10,811,323
- Issue date Oct 20, 2020
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus to determine a patterning process parameter, a...
- Patent number 10,615,084
- Issue date Apr 7, 2020
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to determine a patterning process parameter
- Patent number 10,546,790
- Issue date Jan 28, 2020
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for monitoring vital signs
- Patent number 10,542,925
- Issue date Jan 28, 2020
- Koninklijke Philips N.V.
- Ihor Olehovych Kirenko
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for measuring a parameter of a lithographic pr...
- Patent number 10,481,503
- Issue date Nov 19, 2019
- ASML Netherlands B.V.
- Maurits Van Der Schaar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus to determine a patterning process parameter us...
- Patent number 10,453,758
- Issue date Oct 22, 2019
- ASML Netherlands B.V.
- Adriaan Johan Van Leest
- G01 - MEASURING TESTING
Information Patent Grant
Lithography system, method and computer program product for hierarc...
- Patent number 10,379,446
- Issue date Aug 13, 2019
- ASML Netherlands B.V.
- Alok Verma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus, computer program and lithographic s...
- Patent number 10,369,752
- Issue date Aug 6, 2019
- ASML Netherlands B.V.
- Seyed Iman Mossavat
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method and inspection apparatus and computer program product for as...
- Patent number 9,760,018
- Issue date Sep 12, 2017
- ASML Netherlands B.V.
- Seyed Iman Mossavat
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for obtaining a first signal for analysis to char...
- Patent number 9,524,548
- Issue date Dec 20, 2016
- Koninklijke Philips N.V.
- Ihor Olehovych Kirenko
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Active sound reduction system and method
- Patent number 9,384,727
- Issue date Jul 5, 2016
- Koninklijke Philips N.V.
- Paul Sebastian Booij
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Distortion reduced signal detection
- Patent number 9,241,674
- Issue date Jan 26, 2016
- Koninklijke Philips N.V.
- Adriaan Johan Van Leest
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Audio noise cancelling
- Patent number 9,165,549
- Issue date Oct 20, 2015
- Koninklijke Philips N.V.
- Adriaan Johan Van Leest
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Device and method for extracting information from characteristic si...
- Patent number 9,124,777
- Issue date Sep 1, 2015
- Koninklijke Philips N.V.
- Adriaan Johan Van Leest
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Active audio noise cancelling
- Patent number 8,948,410
- Issue date Feb 3, 2015
- Koninklijke Philips N.V.
- Adriaan Johan Van Leest
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Method and system for obtaining a first signal for analysis to char...
- Patent number 8,938,097
- Issue date Jan 20, 2015
- Koninklijke Philips N.V.
- Ihor Olehovych Kirenko
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and system for obtaining a first signal for analysis to char...
- Patent number 8,666,116
- Issue date Mar 4, 2014
- Koninklijke Philips N.V.
- Ihor Olehovych Kirenko
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and system for processing a signal including at least a comp...
- Patent number 8,649,562
- Issue date Feb 11, 2014
- Koninklijke Philips N.V.
- Gerard De Haan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and system for determining distances between loudspeakers
- Patent number 7,864,631
- Issue date Jan 4, 2011
- Koninklijke Philips Electronics N.V.
- Adriaan Johan Van Leest
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Watermark embedding and detection of a motion image signal
- Patent number 7,844,072
- Issue date Nov 30, 2010
- Civolution B.V.
- Adriaan Johan Van Leest
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20240014078
- Publication date Jan 11, 2024
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING A MEASUREMENT RECIPE AND ASSOCIATED APPARATUSES
- Publication number 20230035073
- Publication date Feb 2, 2023
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20210384086
- Publication date Dec 9, 2021
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20210335678
- Publication date Oct 28, 2021
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20210035871
- Publication date Feb 4, 2021
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20200185281
- Publication date Jun 11, 2020
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20200126872
- Publication date Apr 23, 2020
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Measuring a Parameter of a Lithographic Pr...
- Publication number 20200073254
- Publication date Mar 5, 2020
- ASML NETHERLANDS B.V.
- Maurits VAN DER SCHAAR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20200013685
- Publication date Jan 9, 2020
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20170255738
- Publication date Sep 7, 2017
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20170255736
- Publication date Sep 7, 2017
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20170256465
- Publication date Sep 7, 2017
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20170255737
- Publication date Sep 7, 2017
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER
- Publication number 20170255112
- Publication date Sep 7, 2017
- ASML NETHERLANDS B.V.
- Adriaan Johan VAN LEEST
- G01 - MEASURING TESTING
Information Patent Application
Lithography System, Method and Computer Program Product for Hierarc...
- Publication number 20170090301
- Publication date Mar 30, 2017
- ASML NETHERLANDS B.V.
- Alok VERMA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method And Apparatus for Measuring a Parameter of a Lithographic Pr...
- Publication number 20170059999
- Publication date Mar 2, 2017
- ASML NETHERLANDS B.V.
- Maurits VAN DER SCHAAR
- G01 - MEASURING TESTING
Information Patent Application
Metrology Method and Apparatus, Computer Program and Lithographic S...
- Publication number 20160325504
- Publication date Nov 10, 2016
- ASML NETHERLANDS B.V.
- Seyed Iman MOSSAVAT
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
Method and Inspection Apparatus and Computer Program Product for As...
- Publication number 20160154319
- Publication date Jun 2, 2016
- ASML NETHERLANDS B.V.
- Seyed Iman MOSSAVAT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEVICE AND METHOD FOR MONITORING VITAL SIGNS
- Publication number 20160015308
- Publication date Jan 21, 2016
- IHOR OLEHOVYCH KIRENKO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND SYSTEM FOR OBTAINING A FIRST SIGNAL FOR ANALYSIS TO CHAR...
- Publication number 20150104088
- Publication date Apr 16, 2015
- Koninklijke Philips N.V.
- IHOR OLEHOVYCH KIRENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISTORTION REDUCED SIGNAL DETECTION
- Publication number 20140213861
- Publication date Jul 31, 2014
- Koninklijke Philips N.V.
- Adriaan Johan Van Leest
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND SYSTEM FOR OBTAINING A FIRST SIGNAL FOR ANALYSIS TO CHAR...
- Publication number 20140153800
- Publication date Jun 5, 2014
- Koninklijke Philips N.V.
- IHOR OLEHOVYCH KIRENKO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
VIDEO CODING AND DECODING DEVICES AND METHODS PRESERVING
- Publication number 20130294505
- Publication date Nov 7, 2013
- Koninklijke Philips N.V.
- Ihor Olehovych Kirenko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEVICE AND METHOD FOR EXTRACTING INFORMATION FROM CHARACTERISTIC SI...
- Publication number 20130271591
- Publication date Oct 17, 2013
- Koninklijke Philips Electronics N.V.
- Adriaan Johan Van Leest
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
VIDEO CODING AND DECODING DEVICES AND METHODS PRESERVING PPG RELEVA...
- Publication number 20130272393
- Publication date Oct 17, 2013
- Koninklijke Philips N.V.
- Ihor Olehovych Kirenko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND SYSTEM FOR OBTAINING A FIRST SIGNAL FOR ANALYSIS TO CHAR...
- Publication number 20120195486
- Publication date Aug 2, 2012
- Koninklijke Philips Electronics N.V.
- Ihor Olehovych Kirenko
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND SYSTEM FOR PROCESSING A SIGNAL INCLUDING AT LEAST A COMP...
- Publication number 20120195473
- Publication date Aug 2, 2012
- Koninklijke Philips Electronics N.V.
- Gerard De Haan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOISE REDUCTION FOR AN ACOUSTIC COOLING SYSTEM
- Publication number 20120186271
- Publication date Jul 26, 2012
- Koninklijke Philips Electronics N.V.
- Robertus Leonardus Tousain
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
ACTIVE SOUND REDUCTION SYSTEM AND METHOD
- Publication number 20120163626
- Publication date Jun 28, 2012
- Koninklijke Philips Electronics N.V.
- Paul Sebastian Booij
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Application
AUDIO NOISE CANCELLING
- Publication number 20120057720
- Publication date Mar 8, 2012
- Koninklijke Philips Electronics N.V.
- Adriaan Johan Van Leest
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Adriaan Johan VAN LEEST

Person

Patents Grantslast 30 patents

Method and apparatus to determine a patterning process parameter us...

Method and apparatus to determine a patterning process parameter

Method and apparatus to determine a patterning process parameter

Method and apparatus to determine a patterning process parameter

Method and apparatus to determine a patterning process parameter

Method and apparatus to determine a patterning process parameter

Method and apparatus to determine a patterning process parameter

Method and apparatus for measuring a parameter of a lithographic pr...

Method and apparatus to determine a patterning process parameter

Method and apparatus to determine a patterning process parameter, a...

Method and apparatus to determine a patterning process parameter

Device and method for monitoring vital signs

Method and apparatus for measuring a parameter of a lithographic pr...

Method and apparatus to determine a patterning process parameter us...

Lithography system, method and computer program product for hierarc...

Metrology method and apparatus, computer program and lithographic s...

Method and inspection apparatus and computer program product for as...

Method and system for obtaining a first signal for analysis to char...

Active sound reduction system and method

Distortion reduced signal detection

Audio noise cancelling

Device and method for extracting information from characteristic si...

Active audio noise cancelling

Method and system for obtaining a first signal for analysis to char...

Method and system for obtaining a first signal for analysis to char...

Method and system for processing a signal including at least a comp...

Method of and system for determining distances between loudspeakers

Watermark embedding and detection of a motion image signal

Patents Applicationslast 30 patents

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

METHOD FOR DETERMINING A MEASUREMENT RECIPE AND ASSOCIATED APPARATUSES

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

Method and Apparatus for Measuring a Parameter of a Lithographic Pr...

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

METHOD AND APPARATUS TO DETERMINE A PATTERNING PROCESS PARAMETER

Lithography System, Method and Computer Program Product for Hierarc...

Method And Apparatus for Measuring a Parameter of a Lithographic Pr...

Metrology Method and Apparatus, Computer Program and Lithographic S...

Method and Inspection Apparatus and Computer Program Product for As...

DEVICE AND METHOD FOR MONITORING VITAL SIGNS

METHOD AND SYSTEM FOR OBTAINING A FIRST SIGNAL FOR ANALYSIS TO CHAR...

DISTORTION REDUCED SIGNAL DETECTION

METHOD AND SYSTEM FOR OBTAINING A FIRST SIGNAL FOR ANALYSIS TO CHAR...

VIDEO CODING AND DECODING DEVICES AND METHODS PRESERVING

DEVICE AND METHOD FOR EXTRACTING INFORMATION FROM CHARACTERISTIC SI...

VIDEO CODING AND DECODING DEVICES AND METHODS PRESERVING PPG RELEVA...

METHOD AND SYSTEM FOR OBTAINING A FIRST SIGNAL FOR ANALYSIS TO CHAR...

METHOD AND SYSTEM FOR PROCESSING A SIGNAL INCLUDING AT LEAST A COMP...

NOISE REDUCTION FOR AN ACOUSTIC COOLING SYSTEM

ACTIVE SOUND REDUCTION SYSTEM AND METHOD

AUDIO NOISE CANCELLING