Adriaan Tiemen ZUIDERWEG

Follow

Person

Breda, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring a height map of a test surface
- Patent number 11,493,330
- Issue date Nov 8, 2022
- Mitutoyo Corporation
- Hendrik Ketelaars
- G01 - MEASURING TESTING
Information Patent Grant
Optical interference measuring device
- Patent number 10,794,688
- Issue date Oct 6, 2020
- Mitutoyo Corporation
- Ken Motohashi
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring a height map of multiple fields of view and co...
- Patent number 10,563,974
- Issue date Feb 18, 2020
- Mitutoyo Corporation
- Johannes Anna Quaedackers
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring a high accuracy height map of a test surface
- Patent number 9,881,400
- Issue date Jan 30, 2018
- Mitutoyo Corporation
- Adriaan Tiemen Zuiderweg
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING A HEIGHT MAP OF A TEST SURFACE
- Publication number 20210180943
- Publication date Jun 17, 2021
- MITUTOYO CORPORATION
- Hendrik KETELAARS
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFERENCE MEASURING DEVICE
- Publication number 20190277628
- Publication date Sep 12, 2019
- MITUTOYO CORPORATION
- Ken MOTOHASHI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM HAVING A CONTINUOUSLY VARIABLE BROADBAND REFL...
- Publication number 20180031415
- Publication date Feb 1, 2018
- MITUTOYO CORPORATION
- Han HAITJEMA
- G02 - OPTICS
Information Patent Application
METHOD FOR MEASURING A HEIGHT MAP OF MULTIPLE FIELDS OF VIEW AND CO...
- Publication number 20170052018
- Publication date Feb 23, 2017
- MITUTOYO CORPORATION
- Johannes Anna QUAEDACKERS
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING A HIGH ACCURACY HEIGHT MAP OF A TEST SURFACE
- Publication number 20160027194
- Publication date Jan 28, 2016
- MITUTOYO CORPORATION
- Adriaan Tiemen ZUIDERWEG
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM AND METHOD TO GENERATE AN INTERFERENCE SIGNAL...
- Publication number 20140362383
- Publication date Dec 11, 2014
- MITUTOYO CORPORATION
- Han HAITJEMA
- G02 - OPTICS