Adrian KIERMASZ

Person

Almondsbury, Bristol, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus and method
- Patent number 9,995,783
- Issue date Jun 12, 2018
- Metryx Limited
- Adrian Kiermasz
- C30 - CRYSTAL GROWTH
Information Patent Grant
Semiconductor wafer processing methods and apparatus
- Patent number 9,818,658
- Issue date Nov 14, 2017
- Metryx Limited
- Robert John Wilby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement apparatus and method
- Patent number 9,423,447
- Issue date Aug 23, 2016
- Metryx Limited
- Adrian Kiermasz
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling semiconductor device fabrication
- Patent number 8,594,827
- Issue date Nov 26, 2013
- Metryx Limited
- Adrian Kiermasz
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of controlling semiconductor device fabrication
- Patent number 8,364,302
- Issue date Jan 29, 2013
- Metryx Limited
- Adrian Kiermasz
- G05 - CONTROLLING REGULATING
Information Patent Grant
Measuring apparatus
- Patent number 8,200,447
- Issue date Jun 12, 2012
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 8,200,353
- Issue date Jun 12, 2012
- Metryx Limited
- Robert John Wilby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring apparatus
- Patent number 7,892,863
- Issue date Feb 22, 2011
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for treating a semiconductor substrate
- Patent number 6,242,366
- Issue date Jun 5, 2001
- Trikon Equipments Limited
- Knut Beekman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR WAFER WEIGHING APPARATUS AND METHODS
- Publication number 20170115158
- Publication date Apr 27, 2017
- METRYX LIMITED
- Robert John WILBY
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER PROCESSING METHODS AND APPARATUS
- Publication number 20170005019
- Publication date Jan 5, 2017
- METRYX LIMITED
- Robert John WILBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT APPARATUS AND METHOD
- Publication number 20160306004
- Publication date Oct 20, 2016
- METRYX LIMITED
- Adrian KIERMASZ
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING INFORMATION RELATING TO THE MASS...
- Publication number 20160195424
- Publication date Jul 7, 2016
- METRYX LIMITED
- Robert John WILBY
- G01 - MEASURING TESTING
Information Patent Application
Measurement Apparatus and Method
- Publication number 20140015557
- Publication date Jan 16, 2014
- METRYX LIMITED
- Adrian Kiermasz
- C30 - CRYSTAL GROWTH
Information Patent Application
Method of Controlling Semiconductor Device Fabrication
- Publication number 20130149800
- Publication date Jun 13, 2013
- METRYX LIMITED
- Adrian KIERMASZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Controlling Semiconductor Device Fabrication
- Publication number 20110190919
- Publication date Aug 4, 2011
- Adrian Kiermasz
- G05 - CONTROLLING REGULATING
Information Patent Application
Measuring Apparatus
- Publication number 20110119009
- Publication date May 19, 2011
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20100147078
- Publication date Jun 17, 2010
- Robert John Wilby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING APPARATUS
- Publication number 20080087106
- Publication date Apr 17, 2008
- Robert John Wilby
- G01 - MEASURING TESTING

Adrian KIERMASZ

Person

Patents Grantslast 30 patents

Measurement apparatus and method

Semiconductor wafer processing methods and apparatus

Measurement apparatus and method

Method of controlling semiconductor device fabrication

Method of controlling semiconductor device fabrication

Measuring apparatus

Measuring apparatus

Measuring apparatus

Methods and apparatus for treating a semiconductor substrate

Patents Applicationslast 30 patents

SEMICONDUCTOR WAFER WEIGHING APPARATUS AND METHODS

SEMICONDUCTOR WAFER PROCESSING METHODS AND APPARATUS

MEASUREMENT APPARATUS AND METHOD

METHOD AND DEVICE FOR DETERMINING INFORMATION RELATING TO THE MASS...

Measurement Apparatus and Method

Method of Controlling Semiconductor Device Fabrication

Method of Controlling Semiconductor Device Fabrication

Measuring Apparatus

MEASURING APPARATUS

MEASURING APPARATUS