Adrian Wan-Chew Seet

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New York, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Parametric measurement of high-speed I/O systems
- Patent number 7,571,363
- Issue date Aug 4, 2009
- Agilent Technologies, Inc.
- Hugh S. Wallace
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Parametric Measurement of High-Speed I/O Systems
- Publication number 20070268963
- Publication date Nov 22, 2007
- Hugh S. Wallace
- G01 - MEASURING TESTING