Adriano Zanier

Person

Prilly, CH

People

Patents Grantslast 30 patents

Information Patent Grant
Dimension measuring instrument and height gauge
- Patent number 7,434,331
- Issue date Oct 14, 2008
- TESA SA
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Grant
Probe for three-dimensional measurements
- Patent number 7,281,433
- Issue date Oct 16, 2007
- TESA SA
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Grant
Tool-switching device
- Patent number 7,282,017
- Issue date Oct 16, 2007
- TESA SA
- Pascal Jordil
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Height gauge
- Patent number 7,263,786
- Issue date Sep 4, 2007
- TESA SA
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Grant
Reference gauge for calibrating a measuring machine and method for...
- Patent number 7,043,846
- Issue date May 16, 2006
- TESA SA
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable probe
- Patent number 7,036,239
- Issue date May 2, 2006
- TESA SA
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable probe
- Patent number 6,938,353
- Issue date Sep 6, 2005
- TESA SA
- Claude Rouge
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable probe
- Patent number 6,907,673
- Issue date Jun 21, 2005
- TESA SA
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Grant
Probe
- Patent number D502116
- Issue date Feb 22, 2005
- TESA SA
- Pascal Jordil
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Adjustable probe
- Patent number 6,854,195
- Issue date Feb 15, 2005
- TESA SA
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Grant
Column for measuring longitudinal dimensions
- Patent number 6,802,135
- Issue date Oct 12, 2004
- TESA SA
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Grant
Column for measuring longitudinal dimensions
- Patent number 6,763,604
- Issue date Jul 20, 2004
- Brown & Sharpe TESA SA
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Grant
Trigger probe and method for assembling a trigger probe
- Patent number 6,760,977
- Issue date Jul 13, 2004
- Tesa SA
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Grant
Column for measuring longitudinal dimensions
- Patent number 6,751,884
- Issue date Jun 22, 2004
- Brown & Sharpe TESA SA
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Grant
Height-measuring column and method for regulating a height-measurin...
- Patent number 6,745,488
- Issue date Jun 8, 2004
- Brown & Sharpe TESA SA
- Pascal Jordil
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device for longitudinal measurement
- Patent number 6,247,244
- Issue date Jun 19, 2001
- Brown & Sharpe TESA SA
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Grant
Electronic micrometer
- Patent number 6,243,965
- Issue date Jun 12, 2001
- Brown & Sharpe TESA SA
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring length
- Patent number 5,722,179
- Issue date Mar 3, 1998
- TESA S.A.
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Grant
Linear measuring device and a method of adjusting said device
- Patent number 5,664,336
- Issue date Sep 9, 1997
- Tesa Brown & Sharpe S.A.
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for the measurement of linear values
- Patent number 5,373,645
- Issue date Dec 20, 1994
- Tesa S.A.
- Alex Bezinge
- G01 - MEASURING TESTING
Information Patent Grant
Electronic sensor for the measurement of linear magnitudes
- Patent number 5,072,524
- Issue date Dec 17, 1991
- Tesa S.A.
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Grant
Sensing device for an independent linear-magnitude measurement appa...
- Patent number 4,766,674
- Issue date Aug 30, 1988
- Tesa A.A.
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Grant
Sensor for devices for measuring comparative linear magnitudes
- Patent number 4,658,510
- Issue date Apr 21, 1987
- TESA S.A.
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Grant
Comparator with pivoting feeler
- Patent number 4,389,784
- Issue date Jun 28, 1983
- Tesa, S.A.
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable fork gauge
- Patent number 4,126,940
- Issue date Nov 28, 1978
- Tesa S.A.
- Georges Lendi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Dimension measuring instrument and height gauge
- Publication number 20070245586
- Publication date Oct 25, 2007
- Tesa SA
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Application
Probe for three-dimensional measurements
- Publication number 20060005633
- Publication date Jan 12, 2006
- Tesa SA
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Application
Tool-switching device
- Publication number 20050207857
- Publication date Sep 22, 2005
- Tesa SA
- Pascal Jordil
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Adjustable probe
- Publication number 20040154177
- Publication date Aug 12, 2004
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Application
Adjustable probe
- Publication number 20040154179
- Publication date Aug 12, 2004
- Claude Rouge
- G01 - MEASURING TESTING
Information Patent Application
Adjustable probe
- Publication number 20040149057
- Publication date Aug 5, 2004
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Application
Adjustable probe
- Publication number 20040148792
- Publication date Aug 5, 2004
- Adriano Zanier
- G01 - MEASURING TESTING
Information Patent Application
Reference gauge for calibrating a measuring machine and method for...
- Publication number 20030106229
- Publication date Jun 12, 2003
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Application
Column for measuring longitudinal dimensions
- Publication number 20030106233
- Publication date Jun 12, 2003
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Application
Column for measuring longitudinal dimensions
- Publication number 20030106236
- Publication date Jun 12, 2003
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Application
Column for measuring longitudinal dimensions
- Publication number 20030106234
- Publication date Jun 12, 2003
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Application
Height-measuring column and method for regulating a height-measurin...
- Publication number 20030106235
- Publication date Jun 12, 2003
- Pascal Jordil
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Trigger probe and method for assembling a trigger probe
- Publication number 20030101609
- Publication date Jun 5, 2003
- Pascal Jordil
- G01 - MEASURING TESTING

Adriano Zanier

Person

Patents Grantslast 30 patents

Dimension measuring instrument and height gauge

Probe for three-dimensional measurements

Tool-switching device

Height gauge

Reference gauge for calibrating a measuring machine and method for...

Adjustable probe

Adjustable probe

Adjustable probe

Probe

Adjustable probe

Column for measuring longitudinal dimensions

Column for measuring longitudinal dimensions

Trigger probe and method for assembling a trigger probe

Column for measuring longitudinal dimensions

Height-measuring column and method for regulating a height-measurin...

Device for longitudinal measurement

Electronic micrometer

Device for measuring length

Linear measuring device and a method of adjusting said device

Apparatus for the measurement of linear values

Electronic sensor for the measurement of linear magnitudes

Sensing device for an independent linear-magnitude measurement appa...

Sensor for devices for measuring comparative linear magnitudes

Comparator with pivoting feeler

Adjustable fork gauge

Patents Applicationslast 30 patents

Dimension measuring instrument and height gauge

Probe for three-dimensional measurements

Tool-switching device

Adjustable probe

Adjustable probe

Adjustable probe

Adjustable probe

Reference gauge for calibrating a measuring machine and method for...

Column for measuring longitudinal dimensions

Column for measuring longitudinal dimensions

Column for measuring longitudinal dimensions

Height-measuring column and method for regulating a height-measurin...

Trigger probe and method for assembling a trigger probe