Adrianus Franciscus Johannes Hammen

Person

  • Eindhoven, NL

Patents Grantslast 30 patents

  • Information Patent Grant

    Scanning electron microscope

    • Patent number 10,796,879
    • Issue date Oct 6, 2020
    • Phenom-World Holding B.V.
    • Karel Diederick Van Der Mast
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Sample stage

    • Patent number 10,580,613
    • Issue date Mar 3, 2020
    • Phenom-World Holding B.V.
    • Gerhardus Bernardus Stamsnijder
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE

    • Publication number 20200402760
    • Publication date Dec 24, 2020
    • Phenom-World Holding B.V.
    • Karel Diederick VAN DER MAST
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SAMPLE STAGE

    • Publication number 20190287756
    • Publication date Sep 19, 2019
    • Phenom-World Holding B.V.
    • Gerhardus Bernardus Stamsnijder
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE

    • Publication number 20190103245
    • Publication date Apr 4, 2019
    • Phenom-World Holding B.V.
    • Karel Diederick VAN DER MAST
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Sample Stage

    • Publication number 20170316913
    • Publication date Nov 2, 2017
    • Phenom-World Holding B.V.
    • Gerhardus Bernardus Stamsnijder
    • H01 - BASIC ELECTRIC ELEMENTS