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Adrianus Johannes Hendrikus Schellekens
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Liempde, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for deriving corrections, method and apparatus...
Patent number
11,243,470
Issue date
Feb 8, 2022
ASML Netherlands B.V.
Nitish Kumar
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Alignment system
Patent number
10,585,363
Issue date
Mar 10, 2020
ASML Netherlands B.V.
Simon Gijsbert Josephus Mathijssen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Methods and scatterometers, lithographic systems, and lithographic...
Patent number
9,081,303
Issue date
Jul 14, 2015
ASML Netherlands B.V.
Hugo Augustinus Joseph Cramer
G01 - MEASURING TESTING
Information
Patent Grant
Methods and scatterometers, lithographic systems, and lithographic...
Patent number
8,994,944
Issue date
Mar 31, 2015
ASML Netherlands B.V.
Hugo Augustinus Joseph Cramer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AN IMPROVED HIGH HARMONIC GENERATION APPARATUS
Publication number
20220326152
Publication date
Oct 13, 2022
ASML NETHERLANDS B.V.
Adrianus Johannes Hendrikus SCHELLEKENS
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND APPARATUS FOR DERIVING CORRECTIONS, METHOD AND APPARATUS...
Publication number
20190212660
Publication date
Jul 11, 2019
ASML NETHERLANDS B.V.
Nitish KUMAR
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
ALIGNMENT SYSTEM
Publication number
20180149987
Publication date
May 31, 2018
ASML NETHERLANDS B.V.
Simon Gijsbert Josephus MATHIJSSEN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Methods and Scatterometers, Lithographic Systems, and Lithographic...
Publication number
20140139814
Publication date
May 22, 2014
ASML NETHERLANDS B.V.
Hugo Augustinus Joseph CRAMER
G01 - MEASURING TESTING