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Adrianus Johannes Verkleij
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Nieuwegein, NL
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last 30 patents
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Patent Grant
Apparatus for observing a sample with a particle beam and an optica...
Patent number
7,671,333
Issue date
Mar 2, 2010
FEI Company
Alexandra Valerievna Agronskaja
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
APPARATUS FOR OBSERVING A SAMPLE WITH A PARTICLE BEAM AND AN OPTICA...
Publication number
20080210869
Publication date
Sep 4, 2008
FEI Company
Hans Casper Gerritsen
G01 - MEASURING TESTING