Ae Yong Chung

Person

Cheonan-city, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Real-time optimized testing of semiconductor device
- Patent number 7,689,876
- Issue date Mar 30, 2010
- Samsung Electronics Co., Ltd.
- Ae-yong Chung
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of testing semiconductor devices and handler used for testin...
- Patent number 7,633,288
- Issue date Dec 15, 2009
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having multiple head boards at one handler and its t...
- Patent number 7,602,172
- Issue date Oct 13, 2009
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Test system of semiconductor device having a handler remote control...
- Patent number 7,408,339
- Issue date Aug 5, 2008
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having multiple test sites at one handler and its te...
- Patent number 7,378,864
- Issue date May 27, 2008
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Test system of semiconductor device having a handler remote control...
- Patent number 7,230,417
- Issue date Jun 12, 2007
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Method for electrical testing of semiconductor package that detects...
- Patent number 6,960,908
- Issue date Nov 1, 2005
- Samsung Electronics Co., Ltd.
- Ae-yong Chung
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing a remnant batch of semiconductor devices
- Patent number 6,922,050
- Issue date Jul 26, 2005
- Samsung Electronics Co., Ltd.
- Ae-yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having multiple test sites at one handler and its te...
- Patent number 6,903,567
- Issue date Jun 7, 2005
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
System and method for automatically analyzing and managing loss fac...
- Patent number 6,857,090
- Issue date Feb 15, 2005
- Samsung Electronics Co., Ltd.
- Kyu Sung Lee
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICE
- Publication number 20090140761
- Publication date Jun 4, 2009
- Samsung Electronics Co., Ltd.
- Sung-Ok KIM
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS HAVING MULTIPLE TEST SITES AT ONE HANDLER AND ITS TE...
- Publication number 20080197874
- Publication date Aug 21, 2008
- Samsung Electronics Co., Ltd.
- Ae-Yong CHUNG
- G01 - MEASURING TESTING
Information Patent Application
Real-time optimized testing of semiconductor device
- Publication number 20080022167
- Publication date Jan 24, 2008
- Ae-yong Chung
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM OF SEMICONDUCTOR DEVICE HAVING A HANDLER REMOTE CONTROL...
- Publication number 20070290707
- Publication date Dec 20, 2007
- Samsung Electronics Co., Ltd.
- Ae-Yong CHUNG
- G01 - MEASURING TESTING
Information Patent Application
Method of testing semiconductor devices and handler used for testin...
- Publication number 20070075719
- Publication date Apr 5, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Application
Test system of semiconductor device having a handler remote control...
- Publication number 20060158211
- Publication date Jul 20, 2006
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus having multiple test sites at one handler and its te...
- Publication number 20050168236
- Publication date Aug 4, 2005
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Application
Method for testing a remnant batch of semiconductor devices
- Publication number 20040253753
- Publication date Dec 16, 2004
- Samsung Electronics Co., Ltd.
- Ae-yong Chung
- G01 - MEASURING TESTING
Information Patent Application
Method for electrical testing of semiconductor package that detects...
- Publication number 20040207387
- Publication date Oct 21, 2004
- Ae-yong Chung
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus having multiple test sites at one handler and its te...
- Publication number 20040061491
- Publication date Apr 1, 2004
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Application
System and method for automatically analyzing and managing loss fac...
- Publication number 20030005376
- Publication date Jan 2, 2003
- Kyu Sung Lee
- G01 - MEASURING TESTING

Ae Yong Chung

Person

Patents Grantslast 30 patents

Real-time optimized testing of semiconductor device

Method of testing semiconductor devices and handler used for testin...

Test apparatus having multiple head boards at one handler and its t...

Test system of semiconductor device having a handler remote control...

Test apparatus having multiple test sites at one handler and its te...

Test system of semiconductor device having a handler remote control...

Method for electrical testing of semiconductor package that detects...

Method for testing a remnant batch of semiconductor devices

Test apparatus having multiple test sites at one handler and its te...

System and method for automatically analyzing and managing loss fac...

Patents Applicationslast 30 patents

METHOD OF TESTING SEMICONDUCTOR DEVICE

TEST APPARATUS HAVING MULTIPLE TEST SITES AT ONE HANDLER AND ITS TE...

Real-time optimized testing of semiconductor device

TEST SYSTEM OF SEMICONDUCTOR DEVICE HAVING A HANDLER REMOTE CONTROL...

Method of testing semiconductor devices and handler used for testin...

Test system of semiconductor device having a handler remote control...

Test apparatus having multiple test sites at one handler and its te...

Method for testing a remnant batch of semiconductor devices

Method for electrical testing of semiconductor package that detects...

Test apparatus having multiple test sites at one handler and its te...

System and method for automatically analyzing and managing loss fac...