Aernout Christiaan ZONNEVYLLE

Person

Delft, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,903,042
- Issue date Jan 26, 2021
- TECHNISCHE UNIVERSITEIT DELFT
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,453,649
- Issue date Oct 22, 2019
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated optical and charged particle inspection apparatus
- Patent number 9,715,992
- Issue date Jul 25, 2017
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle multi-beam apparatus including a manipulator devic...
- Patent number 9,607,806
- Issue date Mar 28, 2017
- Mapper Lithography IP B.V.
- Aernout Christiaan Zonnevylle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated optical and charged particle inspection apparatus
- Patent number 9,378,921
- Issue date Jun 28, 2016
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and replaceable door for a vacuum chamber of s...
- Patent number 8,895,921
- Issue date Nov 25, 2014
- Delmic B.V.
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Grant
Multiple beam charged particle optical system
- Patent number 8,294,117
- Issue date Oct 23, 2012
- Mapper Lithography IP B.V.
- Pieter Kruit
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for inspecting a sample using a plurality of c...
- Publication number 20200035447
- Publication date Jan 30, 2020
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for inspecting a sample using a plurality of c...
- Publication number 20170133198
- Publication date May 11, 2017
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS
- Publication number 20150262784
- Publication date Sep 17, 2015
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS
- Publication number 20150108350
- Publication date Apr 23, 2015
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND REPLACEABLE DOOR FOR A VACUUM CHAMBER OF S...
- Publication number 20130200262
- Publication date Aug 8, 2013
- DELMIC B.V.
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE MULTI-BEAMLET APPARATUS
- Publication number 20120305798
- Publication date Dec 6, 2012
- Aernout Christiaan Zonnevylle
- B82 - NANO-TECHNOLOGY
Information Patent Application
MULTIPLE BEAM CHARGED PARTICLE OPTICAL SYSTEM
- Publication number 20110068276
- Publication date Mar 24, 2011
- Pieter Kruit
- B82 - NANO-TECHNOLOGY

Aernout Christiaan ZONNEVYLLE

Person

Patents Grantslast 30 patents

Apparatus and method for inspecting a sample using a plurality of c...

Apparatus and method for inspecting a sample using a plurality of c...

Integrated optical and charged particle inspection apparatus

Charged particle multi-beam apparatus including a manipulator devic...

Integrated optical and charged particle inspection apparatus

Inspection apparatus and replaceable door for a vacuum chamber of s...

Multiple beam charged particle optical system

Patents Applicationslast 30 patents

Apparatus and method for inspecting a sample using a plurality of c...

Apparatus and method for inspecting a sample using a plurality of c...

INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS

INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS

INSPECTION APPARATUS AND REPLACEABLE DOOR FOR A VACUUM CHAMBER OF S...

CHARGED PARTICLE MULTI-BEAMLET APPARATUS

MULTIPLE BEAM CHARGED PARTICLE OPTICAL SYSTEM