Afis Ajala

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Schenectary, NY, US

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Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS OF CORRECTING EFFECTS OF HIGH-ORDER CONCOMITANT...
- Publication number 20240237911
- Publication date Jul 18, 2024
- GE Precision Healthcare LLC
- Afis Ajala
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF CORRECTING EFFECTS OF SECOND-ORDER CONCOMITA...
- Publication number 20240237910
- Publication date Jul 18, 2024
- GE Precision Healthcare LLC
- Seung-Kyun Lee
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF MEASURING AND CORRECTING EFFECTS OF CONCOMIT...
- Publication number 20240241204
- Publication date Jul 18, 2024
- GE Precision Healthcare LLC
- Seung-Kyun Lee
- G01 - MEASURING TESTING
Information Patent Application
DEEP LEARNING-BASED AUTOMATED PARAMETER OPTIMIZATION AND THERAPY SY...
- Publication number 20240138698
- Publication date May 2, 2024
- GE Precision Healthcare LLC
- Afis Ajala
- G06 - COMPUTING CALCULATING COUNTING