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Ahjin JO
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Seoul, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Measuring method for measuring heat distribution of specific space...
Patent number
12,038,455
Issue date
Jul 16, 2024
Park Systems Corp.
Sang-il Park
G01 - MEASURING TESTING
Information
Patent Grant
Measuring method for measuring heat distribution of specific space...
Patent number
11,598,788
Issue date
Mar 7, 2023
Park Systems Corp.
Sang-il Park
G01 - MEASURING TESTING
Information
Patent Grant
Chip carrier exchanging device and atomic force microscopy apparatu...
Patent number
11,175,308
Issue date
Nov 16, 2021
PARK SYSTEMS CORP.
Sang-il Park
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR MEASURING CHARACTERISTICS OF SURFACE OF OBJECT TO BE MEA...
Publication number
20230324434
Publication date
Oct 12, 2023
PARK SYSTEMS CORP.
Ahjin JO
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SUR...
Publication number
20230324433
Publication date
Oct 12, 2023
PARK SYSTEMS CORP.
Ahjin JO
G01 - MEASURING TESTING
Information
Patent Application
MEASURING METHOD FOR MEASURING HEAT DISTRIBUTION OF SPECIFIC SPACE...
Publication number
20230184808
Publication date
Jun 15, 2023
Park Systems Corp.
Sang-il PARK
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR OBTAINING CHARACTERISTICS OF SURFACE TO BE MEASURED, BY...
Publication number
20230046236
Publication date
Feb 16, 2023
PARK SYSTEMS CORP.
Ahjin JO
G01 - MEASURING TESTING
Information
Patent Application
MEASURING METHOD FOR MEASURING HEAT DISTRIBUTION OF SPECIFIC SPACE...
Publication number
20210373046
Publication date
Dec 2, 2021
Park Systems Corp.
Sang-il PARK
G01 - MEASURING TESTING
Information
Patent Application
CHIP CARRIER EXCHANGING DEVICE AND ATOMIC FORCE MICROSCOPY APPARATU...
Publication number
20200386784
Publication date
Dec 10, 2020
PARK SYSTEMS CORP.
Sang-il PARK
G01 - MEASURING TESTING