Ahmed Rashid Syed

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test systems and methods for integrated circuit devices
- Patent number 7,765,443
- Issue date Jul 27, 2010
- Credence Systems Corporation
- Ahmed Rashid Syed
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods associated with test equipment
- Patent number 7,266,739
- Issue date Sep 4, 2007
- Credence Systems Solutions
- Ahmed Rashid Syed
- G11 - INFORMATION STORAGE
Information Patent Grant
Calibration-associated systems and methods
- Patent number 7,242,257
- Issue date Jul 10, 2007
- Credence Systems Corporation
- Ahmed Rashid Syed
- G01 - MEASURING TESTING
Information Patent Grant
Test systems and methods with compensation techniques
- Patent number 7,203,875
- Issue date Apr 10, 2007
- Credence Systems Corporation
- Ahmed Rashid Syed
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Test systems and methods with compensation techniques
- Publication number 20050022081
- Publication date Jan 27, 2005
- Ahmed Rashid Syed
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods associated with test equipment
- Publication number 20050022080
- Publication date Jan 27, 2005
- Ahmed Rashid Syed
- G01 - MEASURING TESTING