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Ahmed Shebl
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Cairo, EG
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Patents Grants
last 30 patents
Information
Patent Grant
Compact material analyzer
Patent number
11,841,268
Issue date
Dec 12, 2023
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Self-referenced spectrometer
Patent number
11,085,825
Issue date
Aug 10, 2021
Si-Ware Systems
Mostafa Medhat
G01 - MEASURING TESTING
Information
Patent Grant
Integrated optical probe card and system for batch testing of optic...
Patent number
10,782,342
Issue date
Sep 22, 2020
Si-Ware Systems
Bassam Saadany
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
OPTO-ELECTRICAL PROBE CARD PLATFORM FOR WAFER-LEVEL TESTING OF OPTI...
Publication number
20230393173
Publication date
Dec 7, 2023
SI-WARE SYSTEMS
Tarek Mohamed Zeinah
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMPACT SPECTRAL ANALYZER
Publication number
20230036551
Publication date
Feb 2, 2023
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
MASS SCREENING BIOLOGICAL DETECTION SOLUTIONS
Publication number
20220397458
Publication date
Dec 15, 2022
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
COMPACT MATERIAL ANALYZER
Publication number
20220244101
Publication date
Aug 4, 2022
SI-WARE SYSTEMS
Yasser M. Sabry
G02 - OPTICS
Information
Patent Application
SELF-REFERENCED SPECTROMETER
Publication number
20190301939
Publication date
Oct 3, 2019
SI-WARE SYSTEMS
Mostafa Medhat
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED OPTICAL PROBE CARD AND SYSTEM FOR BATCH TESTING OF OPTIC...
Publication number
20180143245
Publication date
May 24, 2018
SI-WARE SYSTEMS
Bassam Saadany
B81 - MICRO-STRUCTURAL TECHNOLOGY