Ahmed Zewail

Person

Pasadena, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for electron microscope with multiple cathodes
- Patent number 9,464,998
- Issue date Oct 11, 2016
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of nanoscale structures using an ultrafast electro...
- Patent number 9,053,903
- Issue date Jun 9, 2015
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photon induced near field electron microscope and biological imagin...
- Patent number 8,963,085
- Issue date Feb 24, 2015
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for 4D tomography and ultrafast scanning electron...
- Patent number 8,841,613
- Issue date Sep 23, 2014
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control imaging methods in advanced ultrafast electron microscopy
- Patent number 8,766,181
- Issue date Jul 1, 2014
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of nanoscale structures using an ultrafast electro...
- Patent number 8,686,359
- Issue date Apr 1, 2014
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photon induced near field electron microscope and biological imagin...
- Patent number 8,569,695
- Issue date Oct 29, 2013
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterization of nanoscale structures using an ultrafast electro...
- Patent number 8,440,970
- Issue date May 14, 2013
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photon induced near field electron microscope and biological imagin...
- Patent number 8,429,761
- Issue date Apr 23, 2013
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterization of nanoscale structures using an ultrafast electro...
- Patent number 8,247,769
- Issue date Aug 21, 2012
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
4D imaging in an ultrafast electron microscope
- Patent number 8,203,120
- Issue date Jun 19, 2012
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for ultrafast photoelectron microscope
- Patent number 7,915,583
- Issue date Mar 29, 2011
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for ultrafast photoelectron microscope
- Patent number 7,442,931
- Issue date Oct 28, 2008
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for ultrafast photoelectron microscope
- Patent number 7,154,091
- Issue date Dec 26, 2006
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Luminescent solar energy concentrator devices
- Patent number 4,227,939
- Issue date Oct 14, 1980
- California Institute of Technology
- Ahmed H. Zewail
- F24 - HEATING RANGES VENTILATING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR ELECTRON MICROSCOPE WITH MULTIPLE CATHODES
- Publication number 20160005566
- Publication date Jan 7, 2016
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARACTERIZATION OF NANOSCALE STRUCTURES USING AN ULTRAFAST ELECTRO...
- Publication number 20140158883
- Publication date Jun 12, 2014
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY
- Publication number 20140131574
- Publication date May 15, 2014
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING
Information Patent Application
PHOTON INDUCED NEAR FIELD ELECTRON MICROSCOPE AND BIOLOGICAL IMAGIN...
- Publication number 20140084160
- Publication date Mar 27, 2014
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARACTERIZATION OF NANOSCALE STRUCTURES USING AN ULTRAFAST ELECTRO...
- Publication number 20130234023
- Publication date Sep 12, 2013
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTON INDUCED NEAR FIELD ELECTRON MICROSCOPE AND BIOLOGICAL IMAGIN...
- Publication number 20130234022
- Publication date Sep 12, 2013
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARACTERIZATION OF NANOSCALE STRUCTURES USING AN ULTRAFAST ELECTRO...
- Publication number 20120312986
- Publication date Dec 13, 2012
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR 4D TOMOGRAPHY AND ULTRAFAST SCANNING ELECTRON...
- Publication number 20110284744
- Publication date Nov 24, 2011
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTON INDUCED NEAR FIELD ELECTRON MICROSCOPE AND BIOLOGICAL IMAGIN...
- Publication number 20110220792
- Publication date Sep 15, 2011
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARACTERIZATION OF NANOSCALE STRUCTURES USING AN ULTRAFAST ELECTRO...
- Publication number 20100108883
- Publication date May 6, 2010
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
4D IMAGING IN AN ULTRAFAST ELECTRON MICROSCOPE
- Publication number 20100108882
- Publication date May 6, 2010
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR ULTRAFAST PHOTOELECTRON MICROSCOPE
- Publication number 20090236521
- Publication date Sep 24, 2009
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for ultrafast photoelectron microscope
- Publication number 20080017796
- Publication date Jan 24, 2008
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for ultrafast photoelectron microscope
- Publication number 20050253069
- Publication date Nov 17, 2005
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS

Ahmed Zewail

Person

Patents Grantslast 30 patents

Method and system for electron microscope with multiple cathodes

Characterization of nanoscale structures using an ultrafast electro...

Photon induced near field electron microscope and biological imagin...

Method and system for 4D tomography and ultrafast scanning electron...

Control imaging methods in advanced ultrafast electron microscopy

Characterization of nanoscale structures using an ultrafast electro...

Photon induced near field electron microscope and biological imagin...

Characterization of nanoscale structures using an ultrafast electro...

Photon induced near field electron microscope and biological imagin...

Characterization of nanoscale structures using an ultrafast electro...

4D imaging in an ultrafast electron microscope

Method and system for ultrafast photoelectron microscope

Method and system for ultrafast photoelectron microscope

Method and system for ultrafast photoelectron microscope

Luminescent solar energy concentrator devices

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR ELECTRON MICROSCOPE WITH MULTIPLE CATHODES

CHARACTERIZATION OF NANOSCALE STRUCTURES USING AN ULTRAFAST ELECTRO...

CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY

PHOTON INDUCED NEAR FIELD ELECTRON MICROSCOPE AND BIOLOGICAL IMAGIN...

CHARACTERIZATION OF NANOSCALE STRUCTURES USING AN ULTRAFAST ELECTRO...

PHOTON INDUCED NEAR FIELD ELECTRON MICROSCOPE AND BIOLOGICAL IMAGIN...

CHARACTERIZATION OF NANOSCALE STRUCTURES USING AN ULTRAFAST ELECTRO...

METHOD AND SYSTEM FOR 4D TOMOGRAPHY AND ULTRAFAST SCANNING ELECTRON...

PHOTON INDUCED NEAR FIELD ELECTRON MICROSCOPE AND BIOLOGICAL IMAGIN...

CHARACTERIZATION OF NANOSCALE STRUCTURES USING AN ULTRAFAST ELECTRO...

4D IMAGING IN AN ULTRAFAST ELECTRON MICROSCOPE

METHOD AND SYSTEM FOR ULTRAFAST PHOTOELECTRON MICROSCOPE

Method and system for ultrafast photoelectron microscope

Method and system for ultrafast photoelectron microscope