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Ahmet TOKUZ
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Performing scan data transfer inside multi-die package with serdes...
Patent number
12,216,162
Issue date
Feb 4, 2025
Advanced Micro Devices, Inc.
Ahmet Tokuz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cost-saving scheme for scan testing of 3D stack die
Patent number
12,099,091
Issue date
Sep 24, 2024
Advanced Micro Devices, Inc.
Songgan Zang
G01 - MEASURING TESTING
Information
Patent Grant
Performing scan data transfer inside multi-die package with SERDES...
Patent number
11,762,017
Issue date
Sep 19, 2023
Advanced Micro Devices, Inc.
Ahmet Tokuz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Performing scan data transfer inside multi-die package with SERDES...
Patent number
11,181,579
Issue date
Nov 23, 2021
Advanced Micro Devices, Inc.
Ahmet Tokuz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus to test multi clock domain data paths with a...
Patent number
8,707,117
Issue date
Apr 22, 2014
Advanced Micro Devices, Inc.
Ari Shtulman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PERFORMING SCAN DATA TRANSFER INSIDE MULTI-DIE PACKAGE WITH SERDES...
Publication number
20240027525
Publication date
Jan 25, 2024
ADVANCED MICRO DEVICES, INC.
AHMET TOKUZ
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COST-SAVING SCHEME FOR SCAN TESTING OF 3D STACK DIE
Publication number
20240019493
Publication date
Jan 18, 2024
ADVANCED MICRO DEVICES, INC.
SongGan Zang
G01 - MEASURING TESTING
Information
Patent Application
PERFORMING SCAN DATA TRANSFER INSIDE MULTI-DIE PACKAGE WITH SERDES...
Publication number
20220082623
Publication date
Mar 17, 2022
ADVANCED MICRO DEVICES, INC.
AHMET TOKUZ
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PERFORMING SCAN DATA TRANSFER INSIDE MULTI-DIE PACKAGE WITH SERDES...
Publication number
20210116503
Publication date
Apr 22, 2021
ADVANCED MICRO DEVICES, INC.
AHMET TOKUZ
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND APPARATUS TO TEST MULTI CLOCK DOMAIN DATA PATHS WITH A...
Publication number
20120102376
Publication date
Apr 26, 2012
Advanced Micro Devices, Inc.
Ari SHTULMAN
G01 - MEASURING TESTING