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Ajay Pai
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Bloomington, MN, US
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last 30 patents
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Patent Grant
Method for identification of cotton contaminants with x-ray microto...
Patent number
6,870,897
Issue date
Mar 22, 2005
Texas Tech University System
Hamed Sari-Sarraf
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method for identification of cotton contaminants with x-ray microto...
Publication number
20030123608
Publication date
Jul 3, 2003
Hamed Sari-Sarraf
G01 - MEASURING TESTING