Membership
Tour
Register
Log in
Ajeetkumar Gaddipati
Follow
Person
Waukesha, WI, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Motion correction systems and methods of propeller magnetic resonan...
Patent number
11,474,183
Issue date
Oct 18, 2022
GE Precision Healthcare LLC
Shaorong Chang
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for reduced shading and blurring in magnetic re...
Patent number
10,928,473
Issue date
Feb 23, 2021
General Electric Company
Ajeetkumar Gaddipati
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for accelerated multi-contrast propeller
Patent number
10,884,086
Issue date
Jan 5, 2021
GE Precision Healthcare LLC
Ali Ersoz
G01 - MEASURING TESTING
Information
Patent Grant
System and method for reducing acoustic noise level in MR imaging
Patent number
10,816,623
Issue date
Oct 27, 2020
General Electric Company
Dawei Gui
G01 - MEASURING TESTING
Information
Patent Grant
System and method for reducing acoustic noise level in MR imaging
Patent number
10,132,889
Issue date
Nov 20, 2018
General Electric Company
Dawei Gui
G01 - MEASURING TESTING
Information
Patent Grant
Multiple excitation blade acquisition for motion correction in magn...
Patent number
9,322,894
Issue date
Apr 26, 2016
General Electric Company
Dawei Gui
G01 - MEASURING TESTING
Information
Patent Grant
Motion correction in accelerated T1-weighted magnetic resonance ima...
Patent number
9,103,898
Issue date
Aug 11, 2015
General Electric Company
James Hartman Holmes
G01 - MEASURING TESTING
Information
Patent Grant
System and method for split-echo split-blade data collection for pr...
Patent number
8,384,384
Issue date
Feb 26, 2013
General Electric Company
Xiaoli Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for acquisition and reconstruction of non-CPMG...
Patent number
8,154,293
Issue date
Apr 10, 2012
General Electric Company
Zhiqiang Li
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for vibration-related artifact reduction
Patent number
7,550,972
Issue date
Jun 23, 2009
General Electric Company
Joseph K. Maier
G01 - MEASURING TESTING
Information
Patent Grant
System and method of accelerated MR propeller imaging
Patent number
7,382,127
Issue date
Jun 3, 2008
General Electric Company
Ajeetkumar Gaddipati
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for vibration-related artifact reduction
Patent number
7,239,140
Issue date
Jul 3, 2007
General Electric Company
Joseph K. Maier
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for vibration-related artifact reduction
Patent number
7,138,800
Issue date
Nov 21, 2006
General Electric Company
Joseph K. Maier
G01 - MEASURING TESTING
Information
Patent Grant
Method and system of MR imaging with reduced radial ripple artifacts
Patent number
7,023,207
Issue date
Apr 4, 2006
General Electric Company
Ajeetkumar Gaddipati
G01 - MEASURING TESTING
Information
Patent Grant
K-space based graphic application development system for a medical...
Patent number
6,741,672
Issue date
May 25, 2004
GE Medical Systems Global Technology Company, LLC
Ajeetkumar Gaddipati
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND SYSTEMS FOR REDUCED SHADING AND BLURRING IN MAGNETIC RE...
Publication number
20200088821
Publication date
Mar 19, 2020
GENERAL ELECTRIC COMPANY
Ajeetkumar Gaddipati
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR REDUCING ACOUSTIC NOISE LEVEL IN MR IMAGING
Publication number
20190049536
Publication date
Feb 14, 2019
GENERAL ELECTRIC COMPANY
Dawei Gui
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR REDUCING ACOUSTIC NOISE LEVEL IN MR IMAGING
Publication number
20140347050
Publication date
Nov 27, 2014
GENERAL ELECTRIC COMPANY
Dawei Gui
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE EXCITATION BLADE ACQUISITION FOR MOTION CORRECTION IN MAGN...
Publication number
20140043024
Publication date
Feb 13, 2014
GENERAL ELECTRIC COMPANY
Dawei Gui
G01 - MEASURING TESTING
Information
Patent Application
MOTION CORRECTION IN ACCELERATED T1-WEIGHTED MAGNETIC RESONANCE IMA...
Publication number
20120262172
Publication date
Oct 18, 2012
GENERAL ELECTRIC COMPANY
James Hartman Holmes
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR SPLIT-ECHO SPLIT-BLADE DATA COLLECTION FOR PR...
Publication number
20110241671
Publication date
Oct 6, 2011
Xiaoli Zhao
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR ACQUISITION AND RECONSTRUCTION OF NON-CPMG...
Publication number
20110025325
Publication date
Feb 3, 2011
Zhiqiang Li
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF ACCELERATED MR PROPELLER IMAGING
Publication number
20080068016
Publication date
Mar 20, 2008
Ajeetkumar Gaddipati
G01 - MEASURING TESTING
Information
Patent Application
K-space based graphic application development system for a medical...
Publication number
20030002631
Publication date
Jan 2, 2003
Ajeetkumar Gaddipati
G06 - COMPUTING CALCULATING COUNTING