Ajharali Amanullah

Person

Singapore, SG

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for inspecting a wafer
- Patent number 10,876,975
- Issue date Dec 29, 2020
- SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE. LTD.
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method system for generating 3D composite images of objects and det...
- Patent number 10,504,761
- Issue date Dec 10, 2019
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting a wafer
- Patent number 10,161,881
- Issue date Dec 25, 2018
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for automatically verifying correct die removal...
- Patent number 9,934,565
- Issue date Apr 3, 2018
- ASTI Holdings Limited
- Ajharali Amanullah
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for inspecting a wafer
- Patent number 9,863,889
- Issue date Jan 9, 2018
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for selectively inspecting component sidewalls
- Patent number 9,816,938
- Issue date Nov 14, 2017
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for capturing illumination reflected in multiple...
- Patent number 9,746,426
- Issue date Aug 29, 2017
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting a wafer
- Patent number 8,885,918
- Issue date Nov 11, 2014
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Grant
Patterned wafer defect inspection system and method
- Patent number 8,401,272
- Issue date Mar 19, 2013
- ASTI Holdings Limited
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Grant
Multiple surface inspection system and method
- Patent number 7,869,021
- Issue date Jan 11, 2011
- ASTI Holdings Limited
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Grant
Multiple surface inspection system and method
- Patent number 7,768,633
- Issue date Aug 3, 2010
- ASTI Holdings Limited
- Ajharali Amanullah
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR INSPECTING A WAFER
- Publication number 20190033233
- Publication date Jan 31, 2019
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali AMANULLAH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD SYSTEM FOR GENERATING 3D COMPOSITE IMAGES OF OBJECTS AND DET...
- Publication number 20180226283
- Publication date Aug 9, 2018
- Semiconductor Technologies and Instruments Pte. Lt
- Ajharali AMANULLAH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR AUTOMATICALLY VERIFYING CORRECT DIE REMOVAL...
- Publication number 20160125583
- Publication date May 5, 2016
- ASTI HOLDINGS LIMITED
- Ajharali AMANULLAH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspecting a wafer
- Publication number 20150233840
- Publication date Aug 20, 2015
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SELECTIVELY INSPECTING COMPONENT SIDEWALLS
- Publication number 20150138341
- Publication date May 21, 2015
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali AMANULLAH
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Capturing Illumination Reflected in Multiple...
- Publication number 20120013899
- Publication date Jan 19, 2012
- SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD (SG)
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Application
System and method for inspecting a wafer
- Publication number 20100189339
- Publication date Jul 29, 2010
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspecting a wafer
- Publication number 20100188486
- Publication date Jul 29, 2010
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspecting a wafer
- Publication number 20100188499
- Publication date Jul 29, 2010
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multiple Surface Inspection System and Method
- Publication number 20090073426
- Publication date Mar 19, 2009
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Application
Patterned wafer defect inspection system and method
- Publication number 20090034831
- Publication date Feb 5, 2009
- ASTI Holdings Limited
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Application
Multiple surface inspection system and method
- Publication number 20080246958
- Publication date Oct 9, 2008
- Ajharali Amanullah
- G01 - MEASURING TESTING

Ajharali Amanullah

Person

Patents Grantslast 30 patents

System and method for inspecting a wafer

Method system for generating 3D composite images of objects and det...

System and method for inspecting a wafer

Systems and methods for automatically verifying correct die removal...

System and method for inspecting a wafer

Apparatus and method for selectively inspecting component sidewalls

System and method for capturing illumination reflected in multiple...

System and method for inspecting a wafer

Patterned wafer defect inspection system and method

Multiple surface inspection system and method

Multiple surface inspection system and method

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR INSPECTING A WAFER

METHOD SYSTEM FOR GENERATING 3D COMPOSITE IMAGES OF OBJECTS AND DET...

SYSTEMS AND METHODS FOR AUTOMATICALLY VERIFYING CORRECT DIE REMOVAL...

System and method for inspecting a wafer

APPARATUS AND METHOD FOR SELECTIVELY INSPECTING COMPONENT SIDEWALLS

System and Method for Capturing Illumination Reflected in Multiple...

System and method for inspecting a wafer

System and method for inspecting a wafer

System and method for inspecting a wafer

Multiple Surface Inspection System and Method

Patterned wafer defect inspection system and method

Multiple surface inspection system and method