Ajit P. Paranjpe

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Plasma density monitor and method
- Patent number 5,760,573
- Issue date Jun 2, 1998
- Texas Instruments Incorporated
- Ajit Pramod Paranjpe
- G01 - MEASURING TESTING
Information Patent Grant
Self-guided, self-propelled, convertible cleaning apparatus
- Patent number 5,634,237
- Issue date Jun 3, 1997
- Ajit P. Paranjpe
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Grant
Method for temperature measurement in rapid thermal process systems
- Patent number 5,601,366
- Issue date Feb 11, 1997
- Texas Instruments Incorporated
- Ajit P. Paranjpe
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensor and method
- Patent number 5,501,637
- Issue date Mar 26, 1996
- Texas Instruments Incorporated
- Walter M. Duncan
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction gratings for submicron linewidth measurement
- Patent number 5,422,723
- Issue date Jun 6, 1995
- Texas Instruments Incorporated
- Ajit P. Paranjpe
- G01 - MEASURING TESTING
Information Patent Grant
Process control for submicron linewidth measurement
- Patent number 5,361,137
- Issue date Nov 1, 1994
- Texas Instruments Incorporated
- Thomas J. Aton
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric temperature measurement system and method
- Patent number 5,249,865
- Issue date Oct 5, 1993
- Texas Instruments Incorporated
- Ajit P. Paranjpe
- G01 - MEASURING TESTING

Ajit P. Paranjpe

Person

Patents Grantslast 30 patents

Plasma density monitor and method

Self-guided, self-propelled, convertible cleaning apparatus

Method for temperature measurement in rapid thermal process systems

Temperature sensor and method

Diffraction gratings for submicron linewidth measurement

Process control for submicron linewidth measurement

Interferometric temperature measurement system and method