Akella V. S. Satya

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Wappingers Falls, NY, US

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Patents Grantslast 30 patents

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Defect monitor and method for automated contactless inline wafer in...
- Patent number 5,959,459
- Issue date Sep 28, 1999
- International Business Machines Corporation
- Akella Venkata Surya Satya
- G01 - MEASURING TESTING
Information Patent Grant
Memory system with selective assignment of spare locations
- Patent number 4,450,559
- Issue date May 22, 1984
- International Business Machines Corporation
- George L. Bond
- G11 - INFORMATION STORAGE
Information Patent Grant
Test site for a charged coupled device (CCD) array
- Patent number 4,196,389
- Issue date Apr 1, 1980
- International Business Machines Corporation
- Helen J. Kelly
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit test structure
- Patent number 4,144,493
- Issue date Mar 13, 1979
- International Business Machines Corporation
- James H. Lee
- G01 - MEASURING TESTING
Information Patent Grant
Monitor for semiconductor diffusion operations
- Patent number 4,100,486
- Issue date Jul 11, 1978
- International Business Machines Corporation
- Barry N. Casowitz
- G01 - MEASURING TESTING
Information Patent Grant
Electrical defect monitor structure
- Patent number 3,983,479
- Issue date Sep 28, 1976
- International Business Machines Corporation
- James H. Lee
- G01 - MEASURING TESTING