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Akifumi Hayashi
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Misato-mura, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Non-transitory computer-readable medium, choice selection method, a...
Patent number
11,960,715
Issue date
Apr 16, 2024
Seiko Epson Corporation
Akifumi Hayashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Positioning control method and positioning device
Patent number
11,067,701
Issue date
Jul 20, 2021
Seiko Epson Corporation
Akifumi Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Positioning control method and positioning device
Patent number
10,598,794
Issue date
Mar 24, 2020
Seiko Epson Corporation
Akifumi Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Terminal device, positioning method, and recording medium
Patent number
8,022,865
Issue date
Sep 20, 2011
Seiko Epson Corporation
Shigeru Imafuku
G01 - MEASURING TESTING
Information
Patent Grant
Terminal apparatus, positioning method, control program for termina...
Patent number
7,812,764
Issue date
Oct 12, 2010
Seiko Epson Corporation
Shunichi Mizuochi
G01 - MEASURING TESTING
Information
Patent Grant
Terminal device, positioning method, and recording medium
Patent number
7,679,558
Issue date
Mar 16, 2010
Seiko Epson Corporation
Shigeru Imafuku
G01 - MEASURING TESTING
Information
Patent Grant
Positioning system, terminal device, positioning device, control me...
Patent number
7,664,513
Issue date
Feb 16, 2010
Seiko Epson Corporation
Akifumi Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Terminal apparatus, positioning method, control program for termina...
Patent number
7,535,418
Issue date
May 19, 2009
Seiko Epson Corporation
Shunichi Mizuochi
G01 - MEASURING TESTING
Information
Patent Grant
Positioning system, terminal device, positioning device, control me...
Patent number
7,505,773
Issue date
Mar 17, 2009
Seiko Epson Corporation
Akifumi Hayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Non-Transitory Computer-Readable Medium, Choice Selection Method, A...
Publication number
20240220098
Publication date
Jul 4, 2024
SEIKO EPSON CORPORATION
Akifumi HAYASHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Non-Transitory Computer-Readable Medium, Choice Selection Method, A...
Publication number
20220187984
Publication date
Jun 16, 2022
SEIKO EPSON CORPORATION
Akifumi HAYASHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
POSITIONING CONTROL METHOD AND POSITIONING DEVICE
Publication number
20200183017
Publication date
Jun 11, 2020
SEIKO EPSON CORPORATION
Akifumi HAYASHI
G01 - MEASURING TESTING
Information
Patent Application
POSITIONING CONTROL METHOD AND POSITIONING DEVICE
Publication number
20170299726
Publication date
Oct 19, 2017
SEIKO EPSON CORPORATION
Akifumi HAYASHI
G01 - MEASURING TESTING
Information
Patent Application
MOTION MEASURING DEVICE, MOTION MEASURING SYSTEM, MOTION MEASURING...
Publication number
20160349282
Publication date
Dec 1, 2016
SEIKO EPSON CORPORATION
Naoki GOBARA
G01 - MEASURING TESTING
Information
Patent Application
SPEED ESTIMATION METHOD, SPEED ESTIMATION DEVICE, AND PORTABLE APPA...
Publication number
20150127285
Publication date
May 7, 2015
SEIKO EPSON CORPORATION
Tsubasa SHIRAI
G01 - MEASURING TESTING
Information
Patent Application
TERMINAL DEVICE, POSITIONING METHOD, AND RECORDING MEDIUM
Publication number
20100141524
Publication date
Jun 10, 2010
SEIKO EPSON CORPORATION
Shigeru IMAFUKU
G01 - MEASURING TESTING
Information
Patent Application
TERMINAL APPARATUS, POSITIONING METHOD, CONTROL PROGRAM FOR TERMINA...
Publication number
20090195452
Publication date
Aug 6, 2009
SEIKO EPSON CORPORATION
Shunichi MIZUOCHI
G01 - MEASURING TESTING
Information
Patent Application
TIME INFORMATION MANAGEMENT METHOD AND ELECTRONIC INSTRUMENT
Publication number
20090112471
Publication date
Apr 30, 2009
SEIKO EPSON CORPORATION
Akifumi Hayashi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
POSITIONING SYSTEM, TERMINAL DEVICE, POSITIONING DEVICE, CONTROL ME...
Publication number
20090054083
Publication date
Feb 26, 2009
SEIKO EPSON CORPORATION
Akifumi Hayashi
G01 - MEASURING TESTING
Information
Patent Application
Timepiece
Publication number
20080030402
Publication date
Feb 7, 2008
SEIKO EPSON CORPORATION
Shigeru Imafuku
G01 - MEASURING TESTING
Information
Patent Application
Positioning system, terminal device, information provision device,...
Publication number
20060089155
Publication date
Apr 27, 2006
SEIKO EPSON CORPORATION
Akifumi Hayashi
G01 - MEASURING TESTING
Information
Patent Application
Positioning system, terminal device, positioning device, control me...
Publication number
20060089156
Publication date
Apr 27, 2006
SEIKO EPSON CORPORATION
Akifumi Hayashi
G01 - MEASURING TESTING
Information
Patent Application
Terminal apparatus, positioning method, control program for termina...
Publication number
20050253754
Publication date
Nov 17, 2005
SEIKO EPSON CORPORATION
Shunichi Mizuochi
G01 - MEASURING TESTING