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Akihide MURAKAMI
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Kawasaki-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor device and sensor system
Patent number
8,742,962
Issue date
Jun 3, 2014
Renesas Electronics Corporation
Akihide Murakami
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE AND SENSOR SYSTEM
Publication number
20130120178
Publication date
May 16, 2013
RENESAS ELECTRONICS CORPORATION
Akihide MURAKAMI
G01 - MEASURING TESTING