Akihiko Ando

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Jitter measuring device and method
- Patent number 6,522,122
- Issue date Feb 18, 2003
- Advantest Corporation
- Toshifumi Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Jitter measuring device and method
- Publication number 20010012320
- Publication date Aug 9, 2001
- Toshifumi Watanabe
- G01 - MEASURING TESTING