Akihiko Harada

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Technique for measuring power source noise generated inside integra...
- Patent number 7,948,228
- Issue date May 24, 2011
- Fujitsu Limited
- Takahito Takemoto
- G01 - MEASURING TESTING
Information Patent Grant
Power source noise measuring device, integrated circuit, and semico...
- Patent number 7,635,986
- Issue date Dec 22, 2009
- Fujitsu Limited
- Takahito Takemoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device using dynamic circuit
- Patent number 7,535,790
- Issue date May 19, 2009
- Fujitsu Limited
- Akihiko Harada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Insulated gate type semiconductor device and method for fabricating...
- Patent number 7,135,742
- Issue date Nov 14, 2006
- Fujitsu Limited
- Akihiko Harada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
POWER SOURCE NOISE MEASURING DEVICE, INTEGRATED CIRCUIT, AND SEMICO...
- Publication number 20100052726
- Publication date Mar 4, 2010
- FUJITSU LIMITED
- Takahito TAKEMOTO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20080304338
- Publication date Dec 11, 2008
- FUJITSU LIMITED
- Akihiko HARADA
- G11 - INFORMATION STORAGE
Information Patent Application
POWER SOURCE NOISE MEASURING DEVICE, INTEGRATED CIRCUIT, AND SEMICO...
- Publication number 20080106324
- Publication date May 8, 2008
- FUJITSU LIMITED
- Takahito TAKEMOTO
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device using dynamic circuit
- Publication number 20070242556
- Publication date Oct 18, 2007
- FUJITSU LIMITED
- Akihiko Harada
- G06 - COMPUTING CALCULATING COUNTING