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Akihiko Honma

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Patents Applicationslast 30 patents

  • Information Patent Application

    Scanning probe microscope
    • Publication number 20050217354
    • Publication date Oct 6, 2005
    • Akihiko Honma
    • G01 - MEASURING TESTING
  • Information Patent Application

    Scanning probe microscope
    • Publication number 20030218132
    • Publication date Nov 27, 2003
    • Akihiko Honma
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe scanning device
    • Publication number 20030010928
    • Publication date Jan 16, 2003
    • Ryuichi Matsuzaki
    • B82 - NANO-TECHNOLOGY