TREA

Akihiko Honma

Follow

Person

  • Tokyo, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Scanning probe microscope
    • Patent number 7,066,015
    • Issue date Jun 27, 2006
    • SII NanoTechnology Inc.
    • Akihiko Honma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Scanning probe microscope
    • Patent number 6,904,791
    • Issue date Jun 14, 2005
    • SII NanoTechnology Inc.
    • Akihiko Honma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe scanning device
    • Patent number 6,734,426
    • Issue date May 11, 2004
    • SII NanoTechnology Inc.
    • Ryuichi Matsuzaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Scanning probe microscope
    • Patent number 6,242,736
    • Issue date Jun 5, 2001
    • Seiko Instruments Inc.
    • Akihiko Honma
    • B82 - NANO-TECHNOLOGY
  • Information Patent Grant

    Method of controlling probe microscope
    • Patent number 5,955,660
    • Issue date Sep 21, 1999
    • Seiko Instruments Inc.
    • Akihiko Honma
    • B82 - NANO-TECHNOLOGY
  • Information Patent Grant

    Scanning type probe microscope
    • Patent number 5,506,400
    • Issue date Apr 9, 1996
    • Seiko Instruments Inc.
    • Akihiko Honma
    • B82 - NANO-TECHNOLOGY