Akihiko Okutsu

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and test method
- Patent number 9,081,050
- Issue date Jul 14, 2015
- Fujitsu Semiconductor Limited
- Akihiko Okutsu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and test method
- Patent number 8,633,571
- Issue date Jan 21, 2014
- Fujitsu Semiconductor Limited
- Akihiko Okutsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND TEST METHOD
- Publication number 20140097861
- Publication date Apr 10, 2014
- FUJITSU SEMICONDUCTOR LIMITED
- Akihiko Okutsu
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND TEST METHOD
- Publication number 20130015587
- Publication date Jan 17, 2013
- FUJITSU SEMICONDUCTOR LIMITED
- Akihiko Okutsu
- G01 - MEASURING TESTING