Akihiko Oyama

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Shizuoka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Compound semiconductor multilayer structure, hall device, and hall...
- Patent number 7,388,268
- Issue date Jun 17, 2008
- Asahi Kasei Electronics Co., Ltd.
- Takayuki Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Compound semiconductor multilayer structure, hall device, and hall...
- Publication number 20050042814
- Publication date Feb 24, 2005
- Takayuki Watanabe
- G01 - MEASURING TESTING