Akihiko Sekine

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical property measurement apparatus and optical property measure...
- Patent number 9,476,693
- Issue date Oct 25, 2016
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Fundus observation apparatus and fundus image analyzing apparatus
- Patent number 9,456,745
- Issue date Oct 4, 2016
- Kyoto University
- Akiko Matsumoto
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Ophthalmic observation apparatus
- Patent number 8,724,870
- Issue date May 13, 2014
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Mask-defect inspecting apparatus with movable focusing lens
- Patent number 7,760,349
- Issue date Jul 20, 2010
- Kabushiki Kaisha TOPCON
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Mask defect inspection apparatus
- Patent number 7,551,273
- Issue date Jun 23, 2009
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method
- Patent number 7,522,276
- Issue date Apr 21, 2009
- Kabushiki Kaisha Toshiba
- Toru Tojo
- G01 - MEASURING TESTING
Information Patent Grant
Mask defect inspection apparatus
- Patent number 7,379,176
- Issue date May 27, 2008
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,372,560
- Issue date May 13, 2008
- Kabushiki Kaisha Toshiba
- Toru Tojo
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus
- Patent number 7,348,585
- Issue date Mar 25, 2008
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection method and surface inspection apparatus
- Patent number 7,245,366
- Issue date Jul 17, 2007
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting surface and apparatus for inspecting it
- Patent number 7,154,597
- Issue date Dec 26, 2006
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus
- Patent number 6,104,481
- Issue date Aug 15, 2000
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting slight defects on a photomask pattern
- Patent number 6,100,970
- Issue date Aug 8, 2000
- Kabushiki Kaisha Topcon
- Hisakazu Yoshino
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Surface detecting apparatus
- Patent number 5,912,732
- Issue date Jun 15, 1999
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting slight defects in a photomask p...
- Patent number 5,812,259
- Issue date Sep 22, 1998
- Kabushiki Kaisha Topcon
- Hisakazu Yoshino
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Intraocular length measuring instrument having phase compensating m...
- Patent number 5,349,399
- Issue date Sep 20, 1994
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Process and apparatus for measuring axial eye length
- Patent number 5,347,327
- Issue date Sep 13, 1994
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Apparatus for measuring an intraocular length between anterior and...
- Patent number 5,347,328
- Issue date Sep 13, 1994
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Intraocular length measuring instrument
- Patent number 5,141,302
- Issue date Aug 25, 1992
- Kabushiki Kaisha Topcon
- Akihiro Arai
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scanning and detecting optical device
- Patent number 5,107,106
- Issue date Apr 21, 1992
- Kabushiki Kaisha Topcon
- Isao Minegishi
- G02 - OPTICS
Information Patent Grant
Laser beam scanning type eye fundus observing device
- Patent number 5,088,811
- Issue date Feb 18, 1992
- Kabushiki Kaisha Topcon
- Masayuki Hideshima
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical system in a laser scanning eye fundus camera
- Patent number 5,066,116
- Issue date Nov 19, 1991
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Laser beam scanning type ophthalmological instrument
- Patent number 4,968,130
- Issue date Nov 6, 1990
- Kabushiki Kaisha Topcon
- Masayuki Hideshima
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Eye fundus camera
- Patent number 4,933,756
- Issue date Jun 12, 1990
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Laser beam scanning type eye fundus camera
- Patent number 4,854,691
- Issue date Aug 8, 1989
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Akihiko Sekine
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL PROPERTY MEASUREMENT APPARATUS AND OPTICAL PROPERTY MEASURE...
- Publication number 20150323304
- Publication date Nov 12, 2015
- KABUSHIKI KAISHA TOPCON
- Akihiko SEKINE
- G01 - MEASURING TESTING
Information Patent Application
FUNDUS OBSERVATION APPARATUS AND FUNDUS IMAGE ANALYZING APPARATUS
- Publication number 20150116660
- Publication date Apr 30, 2015
- Kyoto University
- Akiko Matsumoto
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD OF CONTROLLING OPHTHALMIC OBSERVATION APPARATUS AND OPHTHALM...
- Publication number 20140078466
- Publication date Mar 20, 2014
- KABUSHIKI KAISHA TOPCON
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Application
OPHTHALMIC OBSERVATION APPARATUS
- Publication number 20120121158
- Publication date May 17, 2012
- KABUSHIKI KAISHA TOPCON
- Akihiko Sekine
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Mask defect inspection apparatus
- Publication number 20080204723
- Publication date Aug 28, 2008
- Kabushiki Kaisha TOPCON
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD
- Publication number 20080151230
- Publication date Jun 26, 2008
- Toru Tojo
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus
- Publication number 20050270522
- Publication date Dec 8, 2005
- Kabushiki Kaisha TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Mask defect inspection apparatus
- Publication number 20050213083
- Publication date Sep 29, 2005
- Kabushiki Kaisha TOPCON
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Application
Mask-defect inspecting apparatus
- Publication number 20050213084
- Publication date Sep 29, 2005
- Kabushiki Kaisha TOPCON
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Application
Method for inspecting surface and apparatus for inspecting it
- Publication number 20040263835
- Publication date Dec 30, 2004
- KABUSHIKI KAISHA TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection apparatus
- Publication number 20040252296
- Publication date Dec 16, 2004
- Toru Tojo
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection method and surface inspection apparatus
- Publication number 20040252295
- Publication date Dec 16, 2004
- KABUSHIKI KAISHA TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus
- Publication number 20040169853
- Publication date Sep 2, 2004
- Yoichiro Iwa
- G01 - MEASURING TESTING
Information Patent Application
Laser light source device and surface inspection apparatus using it
- Publication number 20040095572
- Publication date May 20, 2004
- KABUSHIKI KAISHA TOPCON
- Yoichiro Iwa
- G02 - OPTICS

Akihiko Sekine

Person

Patents Grantslast 30 patents

Optical property measurement apparatus and optical property measure...

Fundus observation apparatus and fundus image analyzing apparatus

Ophthalmic observation apparatus

Mask-defect inspecting apparatus with movable focusing lens

Mask defect inspection apparatus

Pattern inspection method

Mask defect inspection apparatus

Pattern inspection apparatus

Surface inspection apparatus

Surface inspection method and surface inspection apparatus

Method for inspecting surface and apparatus for inspecting it

Surface inspection apparatus

Apparatus for inspecting slight defects on a photomask pattern

Surface detecting apparatus

Method and apparatus for inspecting slight defects in a photomask p...

Intraocular length measuring instrument having phase compensating m...

Process and apparatus for measuring axial eye length

Apparatus for measuring an intraocular length between anterior and...

Intraocular length measuring instrument

Scanning and detecting optical device

Laser beam scanning type eye fundus observing device

Optical system in a laser scanning eye fundus camera

Laser beam scanning type ophthalmological instrument

Eye fundus camera

Laser beam scanning type eye fundus camera

Patents Applicationslast 30 patents

OPTICAL PROPERTY MEASUREMENT APPARATUS AND OPTICAL PROPERTY MEASURE...

FUNDUS OBSERVATION APPARATUS AND FUNDUS IMAGE ANALYZING APPARATUS

METHOD OF CONTROLLING OPHTHALMIC OBSERVATION APPARATUS AND OPHTHALM...

OPHTHALMIC OBSERVATION APPARATUS

Mask defect inspection apparatus

PATTERN INSPECTION METHOD

Surface inspection apparatus

Mask defect inspection apparatus

Mask-defect inspecting apparatus

Method for inspecting surface and apparatus for inspecting it

Pattern inspection apparatus

Surface inspection method and surface inspection apparatus

Surface inspection apparatus

Laser light source device and surface inspection apparatus using it