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Akihiko TAKIZAWA
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Yokohama-shi, JP
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Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
Publication number
20130169793
Publication date
Jul 4, 2013
SHIBAURA MECHATRONICS CORPORATION
Yoshinori HAYASHI
G01 - MEASURING TESTING
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Patent Application
ILLUMINATION SYSTEM, ILLUMINATION METHOD, AND INSPECTION SYSTEM
Publication number
20130169795
Publication date
Jul 4, 2013
SHIBAURA MECHATRONICS CORPORATION
Yoshinori HAYASHI
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR