TREA

Akihiro ENDOU

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,320,443
    • Issue date May 3, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hiroya Umeki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200249249
    • Publication date Aug 6, 2020
    • Hitachi High-Technologies Corporation
    • Hiroya UMEKI
    • G01 - MEASURING TESTING