Akihiro GORYU

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 12,107,159
- Issue date Oct 1, 2024
- Kabushiki Kaisha Toshiba
- Yusuke Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and inspection device
- Patent number 12,040,303
- Issue date Jul 16, 2024
- Kabushiki Kaisha Toshiba
- Mitsuaki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 11,777,028
- Issue date Oct 3, 2023
- Kabushiki Kaisha Toshiba
- Yusuke Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device inspection apparatus, semiconductor device ins...
- Patent number 11,156,654
- Issue date Oct 26, 2021
- Kabushiki Kaisha Toshiba
- Akihiro Goryu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device, inspection system, intelligent power module, ins...
- Patent number 11,079,427
- Issue date Aug 3, 2021
- Kabushiki Kaisha Toshiba
- Mitsuaki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor storage device, method of controlling semiconductor s...
- Patent number 11,018,227
- Issue date May 25, 2021
- Kabushiki Kaisha Toshiba
- Akihiro Goryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing semiconductor device
- Patent number 10,861,941
- Issue date Dec 8, 2020
- Kabushiki Kaisha Toshiba
- Akira Kano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 10,847,620
- Issue date Nov 24, 2020
- Kabushiki Kaisha Toshiba
- Akihiro Goryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing apparatus, image processing method, and storage me...
- Patent number 10,206,587
- Issue date Feb 19, 2019
- Toshiba Medical Systems Corporation
- Akira Kano
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD AND...
- Publication number 20240054272
- Publication date Feb 15, 2024
- Kabushiki Kaisha Toshiba
- Hiro GANGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220293785
- Publication date Sep 15, 2022
- Kabushiki Kaisha Toshiba
- Yusuke KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220190154
- Publication date Jun 16, 2022
- Kabushiki Kaisha Toshiba
- Yusuke KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND COMPUTER PROGRAM PRODUCT
- Publication number 20210293638
- Publication date Sep 23, 2021
- KABUSHIKI KAISHA TOSHIBA
- Mitsuaki KATO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND INSPECTION DEVICE
- Publication number 20210296279
- Publication date Sep 23, 2021
- Kabushiki Kaisha Toshiba
- Mitsuaki KATO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20200075733
- Publication date Mar 5, 2020
- Kabushiki Kaisha Toshiba
- Akira Kano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE, METHOD OF CONTROLLING SEMICONDUCTOR S...
- Publication number 20190288072
- Publication date Sep 19, 2019
- Kabushiki Kaisha Toshiba
- Akihiro Goryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE, INSPECTION SYSTEM, INTELLIGENT POWER MODULE, INS...
- Publication number 20190219628
- Publication date Jul 18, 2019
- Kabushiki Kaisha Toshiba
- Mitsuaki KATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20190221646
- Publication date Jul 18, 2019
- Kabushiki Kaisha Toshiba
- Akihiro GORYU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION APPARATUS, SEMICONDUCTOR DEVICE INS...
- Publication number 20190064248
- Publication date Feb 28, 2019
- Kabushiki Kaisha Toshiba
- Akihiro GORYU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TEST APPARATUS
- Publication number 20180266967
- Publication date Sep 20, 2018
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
HEAT EXCHANGER AND AN AIR CONDITIONER
- Publication number 20180112884
- Publication date Apr 26, 2018
- KABUSHIKI KAISHA TOSHIBA, Tokyo, JAPAN
- Akihiro GORYU
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND STORAGE ME...
- Publication number 20170071479
- Publication date Mar 16, 2017
- TOSHIBA MEDICAL SYSTEMS CORPORATION
- Akira KANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND STORAGE ME...
- Publication number 20150327780
- Publication date Nov 19, 2015
- KABUSHIKI KAISHA TOSHIBA
- Akira KANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Akihiro GORYU

Person

Patents Grantslast 30 patents

Semiconductor device

Semiconductor device and inspection device

Semiconductor device

Semiconductor device inspection apparatus, semiconductor device ins...

Inspection device, inspection system, intelligent power module, ins...

Semiconductor storage device, method of controlling semiconductor s...

Semiconductor device and method of manufacturing semiconductor device

Semiconductor device and method of manufacturing the same

Image processing apparatus, image processing method, and storage me...

Patents Applicationslast 30 patents

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD AND...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

ANALYSIS APPARATUS, ANALYSIS METHOD, AND COMPUTER PROGRAM PRODUCT

SEMICONDUCTOR DEVICE AND INSPECTION DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR STORAGE DEVICE, METHOD OF CONTROLLING SEMICONDUCTOR S...

INSPECTION DEVICE, INSPECTION SYSTEM, INTELLIGENT POWER MODULE, INS...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE INSPECTION APPARATUS, SEMICONDUCTOR DEVICE INS...

OPTICAL TEST APPARATUS

HEAT EXCHANGER AND AN AIR CONDITIONER

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND STORAGE ME...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND STORAGE ME...