Akihiro OTAKA

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,694,324
- Issue date Jul 4, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device inspection method and semiconductor device ins...
- Patent number 11,047,792
- Issue date Jun 29, 2021
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Image generating method, image generating device, image generating...
- Patent number 11,009,531
- Issue date May 18, 2021
- Hamamatsu Photonics K.K.
- Akihiro Otaka
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 10,698,006
- Issue date Jun 30, 2020
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Image generating method, image generating device, image generating...
- Patent number 10,656,187
- Issue date May 19, 2020
- Hamamatsu Photonics K.K.
- Akihiro Otaka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for frequency analyzing a measurement target and method o...
- Patent number 9,618,550
- Issue date Apr 11, 2017
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing a semiconductor device and method of testing...
- Patent number 9,618,576
- Issue date Apr 11, 2017
- Hamamatsu Photonics K.K.
- Akihiro Otaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230289950
- Publication date Sep 14, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20220198644
- Publication date Jun 23, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE GENERATING METHOD, IMAGE GENERATING DEVICE, IMAGE GENERATING...
- Publication number 20200241054
- Publication date Jul 30, 2020
- HAMAMATSU PHOTONICS K. K.
- Akihiro OTAKA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
- Publication number 20190212252
- Publication date Jul 11, 2019
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE GENERATIING METHOD, IMAGE GENERATIING DEVICE, IMAGE GENERATIN...
- Publication number 20190064228
- Publication date Feb 28, 2019
- Hamamatsu Photonics K.K.
- Akihiro OTAKA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20180031614
- Publication date Feb 1, 2018
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE AND METHOD OF TESTING...
- Publication number 20150153408
- Publication date Jun 4, 2015
- HAMAMATSU PHOTONICS K. K.
- Akihiro OTAKA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR FREQUENCY ANALYZING A MEASUREMENT TARGET AND METHOD O...
- Publication number 20150130474
- Publication date May 14, 2015
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING

Akihiro OTAKA

Person

Patents Grantslast 30 patents

Inspection apparatus and inspection method

Semiconductor device inspection method and semiconductor device ins...

Image generating method, image generating device, image generating...

Inspection method and inspection apparatus

Image generating method, image generating device, image generating...

Apparatus for frequency analyzing a measurement target and method o...

Apparatus for testing a semiconductor device and method of testing...

Patents Applicationslast 30 patents

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

IMAGE GENERATING METHOD, IMAGE GENERATING DEVICE, IMAGE GENERATING...

SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...

IMAGE GENERATIING METHOD, IMAGE GENERATIING DEVICE, IMAGE GENERATIN...

INSPECTION METHOD AND INSPECTION APPARATUS

APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE AND METHOD OF TESTING...

APPARATUS FOR FREQUENCY ANALYZING A MEASUREMENT TARGET AND METHOD O...