Akihiro Taki

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Hitachi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for evaluating length of defect in eddy curren...
- Patent number 8,339,130
- Issue date Dec 25, 2012
- Hitachi, Ltd.
- Akira Nishimizu
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current flaw detection probe
- Patent number 8,228,058
- Issue date Jul 24, 2012
- Hitachi-GE Nuclear Energy, Ltd.
- Akira Nishimizu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating length of defect in eddy curren...
- Patent number 7,911,206
- Issue date Mar 22, 2011
- Hitachi, Ltd.
- Akira Nishimizu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR EVALUATING LENGTH OF DEFECT IN EDDY CURREN...
- Publication number 20110148404
- Publication date Jun 23, 2011
- Akira NISHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT FLAW DETECTION PROBE
- Publication number 20090009162
- Publication date Jan 8, 2009
- Akira NISHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING LENGTH OF DEFECT IN EDDY CURREN...
- Publication number 20080004817
- Publication date Jan 3, 2008
- Akira NISHIMIZU
- G01 - MEASURING TESTING