Akihiro YAMAMOTO

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Kyoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analysis device
- Patent number 11,644,476
- Issue date May 9, 2023
- ARKRAY, Inc.
- Akihiro Yamamoto
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis device and positioning method
- Patent number 11,619,644
- Issue date Apr 4, 2023
- ARKRAY, Inc.
- Akihiro Yamamoto
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis device and positioning method
- Patent number 11,467,175
- Issue date Oct 11, 2022
- ARKRAY, Inc.
- Akihiro Yamamoto
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis device
- Patent number 11,415,586
- Issue date Aug 16, 2022
- ARKRAY, Inc.
- Akihiro Yamamoto
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis device
- Patent number 11,327,006
- Issue date May 10, 2022
- ARKRAY, Inc.
- Akihiro Yamamoto
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS DEVICE AND POSITIONING METHOD
- Publication number 20220413001
- Publication date Dec 29, 2022
- ARKRAY, INC.
- Akihiro YAMAMOTO
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ANALYSIS DEVICE
- Publication number 20190128915
- Publication date May 2, 2019
- ARKRAY, INC.
- Akihiro YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND POSITIONING METHOD
- Publication number 20190128914
- Publication date May 2, 2019
- ARKRAY, INC.
- Akihiro YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE
- Publication number 20190128912
- Publication date May 2, 2019
- ARKRAY, INC.
- Akihiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE
- Publication number 20190128796
- Publication date May 2, 2019
- ARKRAY, INC.
- Akihiro YAMAMOTO
- G01 - MEASURING TESTING