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Akihiro YASUI

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis device and automatic analysis method of specimen
    • Patent number 12,360,077
    • Issue date Jul 15, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Masashi Fukaya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device and automatic analysis method
    • Patent number 12,241,905
    • Issue date Mar 4, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Kohei Hiroki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device, cold storage, and method for cooling rea...
    • Patent number 12,196,773
    • Issue date Jan 14, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi Nakajima
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device
    • Patent number 12,186,758
    • Issue date Jan 7, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automated analyzer and cleaning method
    • Patent number 12,174,210
    • Issue date Dec 24, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Masashi Fukaya
    • C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
  • Information Patent Grant

    Automatic analysis device and automatic analysis system
    • Patent number 12,092,649
    • Issue date Sep 17, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Rie Horiuchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device, automatic analysis system, and automatic...
    • Patent number 12,085,582
    • Issue date Sep 10, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Tsukasa Suenari
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 12,031,995
    • Issue date Jul 9, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Kohei Hiroki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer, automatic analysis system, and automatic sample...
    • Patent number 11,977,050
    • Issue date May 7, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Masashi Fukaya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device, and method for conveying sample
    • Patent number 11,971,423
    • Issue date Apr 30, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Naoto Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,933,802
    • Issue date Mar 19, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device
    • Patent number 11,826,759
    • Issue date Nov 28, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automated analysis device
    • Patent number 11,662,357
    • Issue date May 30, 2023
    • Hitachi High-Technologies Corporation
    • Masashi Akutsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,619,639
    • Issue date Apr 4, 2023
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,486,887
    • Issue date Nov 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Masashi Akutsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,268,971
    • Issue date Mar 8, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa Makino
    • A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
  • Information Patent Grant

    Automated analysis device
    • Patent number 11,235,334
    • Issue date Feb 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer and cleaning method
    • Patent number 11,231,433
    • Issue date Jan 25, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yoshiki Muramatsu
    • B08 - CLEANING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,143,665
    • Issue date Oct 12, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,041,874
    • Issue date Jun 22, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Saori Chida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,962,558
    • Issue date Mar 30, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Clinical analyzer
    • Patent number D909609
    • Issue date Feb 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Sample supply unit
    • Patent number D909610
    • Issue date Feb 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Clinical analyzer
    • Patent number D909607
    • Issue date Feb 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Clinical analyzer
    • Patent number D909608
    • Issue date Feb 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Automated analysis device
    • Patent number 10,717,087
    • Issue date Jul 21, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyser and method
    • Patent number 10,690,690
    • Issue date Jun 23, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer device
    • Patent number 10,302,668
    • Issue date May 28, 2019
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 10,184,948
    • Issue date Jan 22, 2019
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,891,240
    • Issue date Feb 13, 2018
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents