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Akihiro YASUI

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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis device, cold storage, and method for cooling rea...
    • Patent number 12,196,773
    • Issue date Jan 14, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi Nakajima
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device
    • Patent number 12,186,758
    • Issue date Jan 7, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automated analyzer and cleaning method
    • Patent number 12,174,210
    • Issue date Dec 24, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Masashi Fukaya
    • C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
  • Information Patent Grant

    Automatic analysis device and automatic analysis system
    • Patent number 12,092,649
    • Issue date Sep 17, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Rie Horiuchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device, automatic analysis system, and automatic...
    • Patent number 12,085,582
    • Issue date Sep 10, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Tsukasa Suenari
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 12,031,995
    • Issue date Jul 9, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Kohei Hiroki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer, automatic analysis system, and automatic sample...
    • Patent number 11,977,050
    • Issue date May 7, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Masashi Fukaya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device, and method for conveying sample
    • Patent number 11,971,423
    • Issue date Apr 30, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Naoto Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,933,802
    • Issue date Mar 19, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device
    • Patent number 11,826,759
    • Issue date Nov 28, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automated analysis device
    • Patent number 11,662,357
    • Issue date May 30, 2023
    • Hitachi High-Technologies Corporation
    • Masashi Akutsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,619,639
    • Issue date Apr 4, 2023
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,486,887
    • Issue date Nov 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Masashi Akutsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,268,971
    • Issue date Mar 8, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa Makino
    • A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
  • Information Patent Grant

    Automated analysis device
    • Patent number 11,235,334
    • Issue date Feb 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer and cleaning method
    • Patent number 11,231,433
    • Issue date Jan 25, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yoshiki Muramatsu
    • B08 - CLEANING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,143,665
    • Issue date Oct 12, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,041,874
    • Issue date Jun 22, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Saori Chida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,962,558
    • Issue date Mar 30, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Clinical analyzer
    • Patent number D909609
    • Issue date Feb 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Sample supply unit
    • Patent number D909610
    • Issue date Feb 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Clinical analyzer
    • Patent number D909607
    • Issue date Feb 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Clinical analyzer
    • Patent number D909608
    • Issue date Feb 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Automated analysis device
    • Patent number 10,717,087
    • Issue date Jul 21, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyser and method
    • Patent number 10,690,690
    • Issue date Jun 23, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer device
    • Patent number 10,302,668
    • Issue date May 28, 2019
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 10,184,948
    • Issue date Jan 22, 2019
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,891,240
    • Issue date Feb 13, 2018
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,772,264
    • Issue date Sep 26, 2017
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 9,442,128
    • Issue date Sep 13, 2016
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Automatic Analyzer and Method of Storing Reagent in Automatic Analyzer
    • Publication number 20240042448
    • Publication date Feb 8, 2024
    • Hitachi High-Tech Corporation
    • Hiroya UMEKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20240017263
    • Publication date Jan 18, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro YASUI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automated Analysis Device
    • Publication number 20230258672
    • Publication date Aug 17, 2023
    • Hitachi High-Technologies Corporation
    • Masashi AKUTSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus
    • Publication number 20230258674
    • Publication date Aug 17, 2023
    • Hitachi High-Tech Corporation
    • Rie Horiuchi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND MAINTENANCE METHOD FOR AUTOMATIC ANALYZER
    • Publication number 20230194556
    • Publication date Jun 22, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Masahiro SHIROTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND ASSEMBLY SUPPORT SYSTEM THEREOF
    • Publication number 20230160917
    • Publication date May 25, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Shunsuke MIYAMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD OF SPECIMEN
    • Publication number 20220236213
    • Publication date Jul 28, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Masashi Fukaya
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Device, Cold Storage, and Method For Cooling Rea...
    • Publication number 20220178959
    • Publication date Jun 9, 2022
    • Hitachi High-Tech Corporation
    • Satoshi NAKAJIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220170956
    • Publication date Jun 2, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20220111391
    • Publication date Apr 14, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER AND CLEANING METHOD
    • Publication number 20220034927
    • Publication date Feb 3, 2022
    • Hitachi High-Tech Corporation
    • Masashi Fukaya
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20220018867
    • Publication date Jan 20, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Kohei HIROKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis System and Specimen Conveying Method
    • Publication number 20220011333
    • Publication date Jan 13, 2022
    • Satoshi NAKAJIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE, AUTOMATIC ANALYSIS SYSTEM, AND AUTOMATIC...
    • Publication number 20210389337
    • Publication date Dec 16, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Tsukasa SUENARI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER, AUTOMATIC ANALYSIS SYSTEM, AND AUTOMATIC SAMPLE...
    • Publication number 20210382000
    • Publication date Dec 9, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Masashi Fukaya
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210247412
    • Publication date Aug 12, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Kohei HIROKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE, AND METHOD FOR CONVEYING SAMPLE
    • Publication number 20210239721
    • Publication date Aug 5, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Naoto SUZUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS SYSTEM
    • Publication number 20210223275
    • Publication date Jul 22, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Rie Horiuchi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20200330998
    • Publication date Oct 22, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro YASUI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automated Analyzer
    • Publication number 20200292566
    • Publication date Sep 17, 2020
    • Hitachi High-Technologies Corporation
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analysis Device
    • Publication number 20200271678
    • Publication date Aug 27, 2020
    • Hitachi High-Technologies Corporation
    • Masashi AKUTSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20200264201
    • Publication date Aug 20, 2020
    • Hitachi High-Technologies Corporation
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20200096529
    • Publication date Mar 26, 2020
    • Hitachi High-Technologies Corporation
    • Saori CHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20200009572
    • Publication date Jan 9, 2020
    • Hitachi High-Technologies Corporation
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190361042
    • Publication date Nov 28, 2019
    • Hitachi High-Technologies Corporation
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer
    • Publication number 20190317119
    • Publication date Oct 17, 2019
    • Hitachi High-Technologies Corporation
    • Masashi AKUTSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND CLEANING METHOD
    • Publication number 20190049477
    • Publication date Feb 14, 2019
    • Hitachi High-Technologies Corporation
    • Yoshiki MURAMATSU
    • B08 - CLEANING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20180128847
    • Publication date May 10, 2018
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSER AND METHOD
    • Publication number 20180120340
    • Publication date May 3, 2018
    • Hitachi High-Technologies Corporation
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20160363604
    • Publication date Dec 15, 2016
    • Hitachi High-Technologies Corporation
    • Akihiro YASUI
    • G01 - MEASURING TESTING