TREA

Akihisa AKAHIRA

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  • Aomori, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe card and inspection apparatus
    • Patent number 8,736,292
    • Issue date May 27, 2014
    • Kabushiki Kaisha Nihon Micronics
    • Tatsuo Ishigaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrical connecting apparatus
    • Patent number 8,508,247
    • Issue date Aug 13, 2013
    • Kabushiki Kaisha Nihon Micronics
    • Katsuji Hoshi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrical connecting apparatus
    • Patent number 7,859,282
    • Issue date Dec 28, 2010
    • Kabushiki Kaisha Nihon Micronics
    • Kiyotoshi Miura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrical connecting apparatus
    • Patent number 7,843,204
    • Issue date Nov 30, 2010
    • Kabushiki Kaisha Nihon Micronics
    • Hidehiro Kiyofuji
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrical connecting apparatus
    • Patent number 7,525,329
    • Issue date Apr 28, 2009
    • Kabushiki Kaisha Nihon Micronics
    • Yuji Miyagi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrical connecting apparatus
    • Patent number 7,468,610
    • Issue date Dec 23, 2008
    • Kabushiki Kaisha Nihon Micronics
    • Yuji Miyagi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe for testing an electrical device
    • Patent number 7,449,906
    • Issue date Nov 11, 2008
    • Kabushiki Kaisha Nihon Micronics
    • Kiyotoshi Miura
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE CARD AND INSPECTION APPARATUS
    • Publication number 20100327898
    • Publication date Dec 30, 2010
    • Kabushiki Kaisha Nihon Micronics
    • Tatsuo Ishigaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20100194416
    • Publication date Aug 5, 2010
    • Kabushiki Kaisha Nihon Micronics
    • Katsuji HOSHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20100066396
    • Publication date Mar 18, 2010
    • Kabushiki Kaisha Nihon Micronics
    • Kiyotoshi Miura
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20090212800
    • Publication date Aug 27, 2009
    • Kabushiki Kaisha Nihon Micronics
    • Hidehiro KIYOFUJI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20080122466
    • Publication date May 29, 2008
    • Kabushiki Kaisha Nihon Micronics
    • Yuji MIYAGI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20080122467
    • Publication date May 29, 2008
    • Kabushiki Kaisha Nihon Micronics
    • Yuji MIYAGI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe For Electric Test
    • Publication number 20070216433
    • Publication date Sep 20, 2007
    • Kiyotoshi Miura
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe assembly
    • Publication number 20070069748
    • Publication date Mar 29, 2007
    • Hidehiro Kiyofuji
    • G01 - MEASURING TESTING