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Akihisa Makino

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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 12,000,849
    • Issue date Jun 4, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device and automatic analysis method
    • Patent number 11,946,941
    • Issue date Apr 2, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Chie Yabutani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device
    • Patent number 11,826,759
    • Issue date Nov 28, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,808,671
    • Issue date Nov 7, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Sakuichiro Adachi
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,579,159
    • Issue date Feb 14, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Rei Konishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,486,887
    • Issue date Nov 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Masashi Akutsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,293,935
    • Issue date Apr 5, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Rei Konishi
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,268,971
    • Issue date Mar 8, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa Makino
    • A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
  • Information Patent Grant

    Automated analysis device
    • Patent number 11,235,334
    • Issue date Feb 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,209,448
    • Issue date Dec 28, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,199,559
    • Issue date Dec 14, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,067,590
    • Issue date Jul 20, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Rei Konishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer and control method for same
    • Patent number 11,054,433
    • Issue date Jul 6, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yuya Matsuoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device
    • Patent number 10,989,708
    • Issue date Apr 27, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Chie Yabutani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,788,479
    • Issue date Sep 29, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis apparatus including a reaction container holding...
    • Patent number 10,753,870
    • Issue date Aug 25, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Yuya Matsuoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device and automatic analysis method
    • Patent number 10,746,748
    • Issue date Aug 18, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Chie Yabutani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device, automatic analysis system, and automatic...
    • Patent number 10,725,028
    • Issue date Jul 28, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Toshiyuki Inabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device
    • Patent number 10,717,087
    • Issue date Jul 21, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,690,688
    • Issue date Jun 23, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Rei Konishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 10,684,298
    • Issue date Jun 16, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa Makino
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automated analyzer
    • Patent number 10,520,522
    • Issue date Dec 31, 2019
    • Hitachi High-Technologies Corporation
    • Keiko Yoshikawa
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,495,658
    • Issue date Dec 3, 2019
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 10,466,261
    • Issue date Nov 5, 2019
    • Hitachi High-Technologies Corporation
    • Minoru Sano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,416,179
    • Issue date Sep 17, 2019
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 10,330,692
    • Issue date Jun 25, 2019
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 10,330,604
    • Issue date Jun 25, 2019
    • Hitachi High-Technologies Corporation
    • Rei Konishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device and analysis method
    • Patent number 10,295,555
    • Issue date May 21, 2019
    • Hitachi High-Technologies Corporation
    • Chie Yabutani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis apparatus
    • Patent number 10,267,817
    • Issue date Apr 23, 2019
    • Hitachi High-Technologies Corporation
    • Tatsuya Sakai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,970,948
    • Issue date May 15, 2018
    • Hitachi High-Technologies Corporation
    • Toshiyuki Shimamori
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20240272186
    • Publication date Aug 15, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20240192234
    • Publication date Jun 13, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20240017263
    • Publication date Jan 18, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro YASUI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    DISPENSING DEVICE, AUTOMATED ANALYSIS DEVICE, AND DISPENSING METHOD
    • Publication number 20230236056
    • Publication date Jul 27, 2023
    • Hitachi High-Tech Corporation
    • Masaaki HIRANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20220111391
    • Publication date Apr 14, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220074959
    • Publication date Mar 10, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210148943
    • Publication date May 20, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Rei KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210025911
    • Publication date Jan 28, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Sakuichiro ADACHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20200330998
    • Publication date Oct 22, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro YASUI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20200326353
    • Publication date Oct 15, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20200264201
    • Publication date Aug 20, 2020
    • Hitachi High-Technologies Corporation
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20200209265
    • Publication date Jul 2, 2020
    • Hitachi High-Technologies Corporation
    • Yuya MATSUOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200200784
    • Publication date Jun 25, 2020
    • Hitachi High-Technologies Corporation
    • Rei KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20200064365
    • Publication date Feb 27, 2020
    • Hitachi High-Technologies Corporation
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20200009572
    • Publication date Jan 9, 2020
    • Hitachi High-Technologies Corporation
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190346470
    • Publication date Nov 14, 2019
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20190339295
    • Publication date Nov 7, 2019
    • Hitachi High-Technologies Corporation
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer
    • Publication number 20190317119
    • Publication date Oct 17, 2019
    • Hitachi High-Technologies Corporation
    • Masashi AKUTSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus
    • Publication number 20190212262
    • Publication date Jul 11, 2019
    • Hitachi High-Technologies Corporation
    • Yuya MATSUOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20190212351
    • Publication date Jul 11, 2019
    • Hitachi High-Technologies Corporation
    • Rei KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20190072577
    • Publication date Mar 7, 2019
    • Hitachi High-Technologies Corporation
    • Rei KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20190041386
    • Publication date Feb 7, 2019
    • Hitachi High-Technologies Corporation
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer and Control Method for Same
    • Publication number 20180275155
    • Publication date Sep 27, 2018
    • Hitachi High-Technologies Corporation
    • Yuya MATSUOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer
    • Publication number 20180259460
    • Publication date Sep 13, 2018
    • Hitachi High-Technologies Corporation
    • Rei KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE, AUTOMATIC ANALYSIS SYSTEM, AND AUTOMATIC...
    • Publication number 20180231537
    • Publication date Aug 16, 2018
    • Hitachi High-Technologies Corporation
    • Toshiyuki INABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20180100871
    • Publication date Apr 12, 2018
    • HITACHI HIGH-TECHNOLOGIES COPRORATION
    • Keiko YOSHIKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20180080948
    • Publication date Mar 22, 2018
    • Hitachi High-Technologies Corporation
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20180074043
    • Publication date Mar 15, 2018
    • Hitachi High-Technologies Corporation
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20170328925
    • Publication date Nov 16, 2017
    • Hitachi High-Technologies Corporation
    • Minoru SANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170269113
    • Publication date Sep 21, 2017
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING