Akihisa Matsuyama

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Position measurement method using a calibration plate to correct a...
- Patent number 11,709,050
- Issue date Jul 25, 2023
- Omron Corporation
- Shingo Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Ultraviolet detector
- Patent number 6,335,529
- Issue date Jan 1, 2002
- Omron Corporation
- Hiroshi Sekii
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POSITION MEASUREMENT METHOD
- Publication number 20220397386
- Publication date Dec 15, 2022
- Omron Corporation
- Shingo HAYASHI
- G01 - MEASURING TESTING