Akihito Otani

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Millimeter waveband filter and method of varying resonant frequency...
- Patent number 9,871,278
- Issue date Jan 16, 2018
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Millimeter waveband filter and method of varying resonant frequency...
- Patent number 9,871,279
- Issue date Jan 16, 2018
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Waveguide switch
- Patent number 9,793,588
- Issue date Oct 17, 2017
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Millimeter waveband filter
- Patent number 9,786,972
- Issue date Oct 10, 2017
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Millimeter-wave band spectrum analysis device and analysis method
- Patent number 9,389,255
- Issue date Jul 12, 2016
- Anritsu Corporation
- Masaaki Fuse
- G01 - MEASURING TESTING
Information Patent Grant
Radio-wave half mirror for millimeter waveband and method of smooth...
- Patent number 9,385,407
- Issue date Jul 5, 2016
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Millimeter waveband filter and method of varying resonant frequency...
- Patent number 9,184,486
- Issue date Nov 10, 2015
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Millimeter waveband filter and method of manufacturing the same
- Patent number 9,160,044
- Issue date Oct 13, 2015
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Millimeter waveband filter and method of increasing rejection band...
- Patent number 8,970,321
- Issue date Mar 3, 2015
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical signal synchronization sampling apparatus and method, and o...
- Patent number 8,098,995
- Issue date Jan 17, 2012
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
Optical signal sampling apparatus and method and optical signal mon...
- Patent number 8,050,558
- Issue date Nov 1, 2011
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
Optical signal quality monitoring apparatus and method
- Patent number 8,041,211
- Issue date Oct 18, 2011
- Anritsu Corporation
- Akihito Otani
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical signal monitoring apparatus and method
- Patent number 8,019,218
- Issue date Sep 13, 2011
- Anritsu Corporation
- Takao Tanimoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Delay time measurement apparatus for optical element
- Patent number 6,788,410
- Issue date Sep 7, 2004
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
Optical sampling waveform measuring apparatus aiming at achieving w...
- Patent number 6,720,548
- Issue date Apr 13, 2004
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
Sum frequency light generation method and sum frequency light gener...
- Patent number 6,697,395
- Issue date Feb 24, 2004
- Anritsu Corporation
- Akihito Otani
- G02 - OPTICS
Information Patent Grant
Waveform measuring method and apparatus
- Patent number 6,677,577
- Issue date Jan 13, 2004
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
Waveform measuring apparatus
- Patent number 6,483,287
- Issue date Nov 19, 2002
- Anritsu Corporation
- Toshinobu Otsubo
- G01 - MEASURING TESTING
Information Patent Grant
Pulse generator
- Patent number 6,483,362
- Issue date Nov 19, 2002
- Anritsu Corporation
- Akihito Otani
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Optical pulse generation system for generating optical pulses havin...
- Patent number 6,483,624
- Issue date Nov 19, 2002
- Anritsu Corporation
- Akihito Otani
- G02 - OPTICS
Information Patent Grant
Waveform measuring apparatus
- Patent number 6,407,686
- Issue date Jun 18, 2002
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
Complementary optical sampling waveform measuring apparatus and pol...
- Patent number 6,154,309
- Issue date Nov 28, 2000
- Anritsu Corporation
- Akihito Otani
- G02 - OPTICS
Information Patent Grant
Wavelength dispersion measuring apparatus and polarization dispersi...
- Patent number 5,995,228
- Issue date Nov 30, 1999
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAVEGUIDE SWITCH
- Publication number 20160172731
- Publication date Jun 16, 2016
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MILLIMETER WAVEBAND FILTER
- Publication number 20160020499
- Publication date Jan 21, 2016
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MILLIMETER WAVEBAND FILTER AND METHOD OF VARYING RESONANT FREQUENCY...
- Publication number 20150263401
- Publication date Sep 17, 2015
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MILLIMETER WAVEBAND FILTER AND METHOD OF VARYING RESONANT FREQUENCY...
- Publication number 20150263400
- Publication date Sep 17, 2015
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MILLIMETER-WAVE BAND SPECTRUM ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20140292305
- Publication date Oct 2, 2014
- Anritsu Corporation
- Masaaki Fuse
- G01 - MEASURING TESTING
Information Patent Application
MILLIMETER WAVEBAND FILTER AND METHOD OF INCREASING REJECTION BAND...
- Publication number 20140015626
- Publication date Jan 16, 2014
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MILLIMETER WAVEBAND FILTER AND METHOD OF MANUFACTURING THE SAME
- Publication number 20130314179
- Publication date Nov 28, 2013
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIO-WAVE HALF MIRROR FOR MILLIMETER WAVEBAND AND METHOD OF SMOOTH...
- Publication number 20130135062
- Publication date May 30, 2013
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MILLIMETER WAVEBAND FILTER AND METHOD OF VARYING RESONANT FREQUENCY...
- Publication number 20130135063
- Publication date May 30, 2013
- Anritsu Corporation
- Takashi Kawamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical signal sampling apparatus and method and optical signal mon...
- Publication number 20100232787
- Publication date Sep 16, 2010
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Application
Optical Signal Quality Monitoring Apparatus and Method
- Publication number 20100150548
- Publication date Jun 17, 2010
- Akihito Otani
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL SIGNAL SYNCHRONIZATION SAMPLING APPARATUS AND METHOD, AND O...
- Publication number 20090232513
- Publication date Sep 17, 2009
- Akihito Otani
- G02 - OPTICS
Information Patent Application
Optical Signal Monitoring Apparatus and Method
- Publication number 20090034966
- Publication date Feb 5, 2009
- Anritsu Corporation
- Takao Tanimoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Optical sampling waveform measuring apparatus aiming at achieving w...
- Publication number 20020139924
- Publication date Oct 3, 2002
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Application
Sum frequency light generation method and sum frequency light gener...
- Publication number 20020141459
- Publication date Oct 3, 2002
- Anritsu Corporation
- Akihito Otani
- G02 - OPTICS
Information Patent Application
Waveform measuring apparatus
- Publication number 20020024458
- Publication date Feb 28, 2002
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Application
Waveform measuring method and apparatus
- Publication number 20020024002
- Publication date Feb 28, 2002
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Application
Pulse generator
- Publication number 20020021160
- Publication date Feb 21, 2002
- Anritsu Corporation
- Akihito Otani
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Waveform measuring apparatus
- Publication number 20020017901
- Publication date Feb 14, 2002
- Anritsu Corporation
- Toshinobu Otsubo
- G01 - MEASURING TESTING

Akihito Otani

Person

Patents Grantslast 30 patents

Millimeter waveband filter and method of varying resonant frequency...

Millimeter waveband filter and method of varying resonant frequency...

Waveguide switch

Millimeter waveband filter

Millimeter-wave band spectrum analysis device and analysis method

Radio-wave half mirror for millimeter waveband and method of smooth...

Millimeter waveband filter and method of varying resonant frequency...

Millimeter waveband filter and method of manufacturing the same

Millimeter waveband filter and method of increasing rejection band...

Optical signal synchronization sampling apparatus and method, and o...

Optical signal sampling apparatus and method and optical signal mon...

Optical signal quality monitoring apparatus and method

Optical signal monitoring apparatus and method

Delay time measurement apparatus for optical element

Optical sampling waveform measuring apparatus aiming at achieving w...

Sum frequency light generation method and sum frequency light gener...

Waveform measuring method and apparatus

Waveform measuring apparatus

Pulse generator

Optical pulse generation system for generating optical pulses havin...

Waveform measuring apparatus

Complementary optical sampling waveform measuring apparatus and pol...

Wavelength dispersion measuring apparatus and polarization dispersi...

Patents Applicationslast 30 patents

WAVEGUIDE SWITCH

MILLIMETER WAVEBAND FILTER

MILLIMETER WAVEBAND FILTER AND METHOD OF VARYING RESONANT FREQUENCY...

MILLIMETER WAVEBAND FILTER AND METHOD OF VARYING RESONANT FREQUENCY...

MILLIMETER-WAVE BAND SPECTRUM ANALYSIS DEVICE AND ANALYSIS METHOD

MILLIMETER WAVEBAND FILTER AND METHOD OF INCREASING REJECTION BAND...

MILLIMETER WAVEBAND FILTER AND METHOD OF MANUFACTURING THE SAME

RADIO-WAVE HALF MIRROR FOR MILLIMETER WAVEBAND AND METHOD OF SMOOTH...

MILLIMETER WAVEBAND FILTER AND METHOD OF VARYING RESONANT FREQUENCY...

Optical signal sampling apparatus and method and optical signal mon...

Optical Signal Quality Monitoring Apparatus and Method

OPTICAL SIGNAL SYNCHRONIZATION SAMPLING APPARATUS AND METHOD, AND O...

Optical Signal Monitoring Apparatus and Method

Optical sampling waveform measuring apparatus aiming at achieving w...

Sum frequency light generation method and sum frequency light gener...

Waveform measuring apparatus

Waveform measuring method and apparatus

Pulse generator

Waveform measuring apparatus