Akihito YAMANO

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray multiple spectroscopic analyzer
- Patent number 8,903,040
- Issue date Dec 2, 2014
- Rigaku Corporation
- Masataka Maeyama
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting specific polymer crystal
- Patent number 8,229,196
- Issue date Jul 24, 2012
- Rigaku Corporation
- Akihito Yamano
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting specific polymer crystal
- Patent number 8,041,086
- Issue date Oct 18, 2011
- Rigaku Corporation
- Akihito Yamano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for estimating specific polymer crystal
- Patent number 7,342,995
- Issue date Mar 11, 2008
- Rigaku Corporation
- Takahisa Sato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...
- Publication number 20250003896
- Publication date Jan 2, 2025
- Rigaku Corporation
- Akihito YAMANO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MULTIPLE SPECTROSCOPIC ANALYZER
- Publication number 20120288058
- Publication date Nov 15, 2012
- Rigaku Corporation
- Masataka MAEYAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING SPECIFIC POLYMER CRYSTAL
- Publication number 20110164795
- Publication date Jul 7, 2011
- Akihito Yamano
- G01 - MEASURING TESTING
Information Patent Application
Specific macromolecule crystal evaluator
- Publication number 20060266954
- Publication date Nov 30, 2006
- Rigaku Corporation
- Takahisa Sato
- G01 - MEASURING TESTING
Information Patent Application
Method for detecting specified polymer crystal
- Publication number 20060222220
- Publication date Oct 5, 2006
- Akihito Yamano
- G01 - MEASURING TESTING
Information Patent Application
Crystal evaluating device
- Publication number 20040258203
- Publication date Dec 23, 2004
- Akihito Yamano
- G01 - MEASURING TESTING