Akiho Nakamura

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring relative rotational angle and scanning transmis...
- Patent number 11,837,433
- Issue date Dec 5, 2023
- Jeol Ltd.
- Akiho Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of aberration measurement and electron microscope
- Patent number 10,886,099
- Issue date Jan 5, 2021
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration measurement method and electron microscope
- Patent number 10,840,058
- Issue date Nov 17, 2020
- Jeol Ltd.
- Yuji Kohno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of Measuring Relative Rotational Angle and Scanning Transmis...
- Publication number 20220262597
- Publication date Aug 18, 2022
- JEOL Ltd.
- Akiho Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Aberration Measurement and Electron Microscope
- Publication number 20190267210
- Publication date Aug 29, 2019
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION MEASUREMENT METHOD AND ELECTRON MICROSCOPE
- Publication number 20190066968
- Publication date Feb 28, 2019
- JEOL Ltd.
- Yuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Method of Image Acquisition and Electron Microscope
- Publication number 20180158646
- Publication date Jun 7, 2018
- JEOL Ltd.
- Akiho Nakamura
- H01 - BASIC ELECTRIC ELEMENTS