Akikazu Odawara

Person

Chiba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence analysis apparatus
- Patent number 9,645,100
- Issue date May 9, 2017
- Hitachi High-Tech Science Corporation
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Radiation analyzer and method for analyzing radiation
- Patent number 9,229,114
- Issue date Jan 5, 2016
- Hitachi High-Tech Science Corporation
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 7,910,888
- Issue date Mar 22, 2011
- SII NanoTechnology Inc.
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting radiometry apparatus
- Patent number 7,789,557
- Issue date Sep 7, 2010
- SII NanoTechnology Inc.
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting X-ray detector and X-ray analysis apparatus using t...
- Patent number 7,589,323
- Issue date Sep 15, 2009
- SII NanoTechnology Inc.
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting X-ray detection apparatus and superconducting X-ray...
- Patent number 7,241,997
- Issue date Jul 10, 2007
- SII NanoTechnology Inc.
- Akikazu Odawara
- G01 - MEASURING TESTING
Information Patent Grant
Cooling apparatus and squid microscope using same
- Patent number 6,810,679
- Issue date Nov 2, 2004
- SII NanoTechnology Inc.
- Akikazu Odawara
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Superconductive quantum interference element
- Patent number 6,552,537
- Issue date Apr 22, 2003
- Seiko Instruments Inc.
- Akikazu Odawara
- G01 - MEASURING TESTING
Information Patent Grant
Cooling apparatus
- Patent number 6,474,079
- Issue date Nov 5, 2002
- Seiko Instruments Inc.
- Akikazu Odawara
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Superconducting quantum interference device
- Patent number 6,323,645
- Issue date Nov 27, 2001
- Seiko Instruments Inc.
- Toshimitsu Morooka
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive method of quantitatively evaluating degree of plasti...
- Patent number 6,111,405
- Issue date Aug 29, 2000
- Seiko Instruments Inc.
- Hiroshi Yamakawa
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting quantum interference device and non-destructive eva...
- Patent number 6,025,713
- Issue date Feb 15, 2000
- Seiko Instruments Inc.
- Toshimitsu Morooka
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting plastic deformation in steel using a differenti...
- Patent number 5,982,172
- Issue date Nov 9, 1999
- Seiko Instruments Inc.
- Noboru Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting quantum interference device fluxmeter and nondestru...
- Patent number 5,854,492
- Issue date Dec 29, 1998
- Seiko Instruments Inc.
- Kazuo Chinone
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspection apparatus with superconducting magnetic s...
- Patent number 5,834,938
- Issue date Nov 10, 1998
- Seiko Instruments Inc.
- Akikazu Odawara
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive testing system using a SQUID
- Patent number 5,825,182
- Issue date Oct 20, 1998
- Seiko Instruments Inc.
- Satoshi Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field detection coils with superconducting wiring pattern...
- Patent number 5,329,229
- Issue date Jul 12, 1994
- Seiko Instruments Inc.
- Norio Chiba
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting a fine magnetic field with characteristic t...
- Patent number 5,280,242
- Issue date Jan 18, 1994
- Seiko Instruments Inc.
- Akikazu Odawara
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting a fine magnetic field with a signal adjusti...
- Patent number 5,231,353
- Issue date Jul 27, 1993
- Seiko Instruments Inc.
- Satoshi Nakayama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY FLUORESCENCE ANALYSIS APPARATUS
- Publication number 20150177167
- Publication date Jun 25, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION ANALYZER AND METHOD FOR ANALYZING RADIATION
- Publication number 20140048717
- Publication date Feb 20, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
Superconducting radiometry apparatus
- Publication number 20100019152
- Publication date Jan 28, 2010
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20090184252
- Publication date Jul 23, 2009
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Superconducting X-Ray Detector And X-Ray Analysis Apparatus Using T...
- Publication number 20070291902
- Publication date Dec 20, 2007
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Three-dimensional structure analyzing system
- Publication number 20060198494
- Publication date Sep 7, 2006
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Superconducting X-ray detection apparatus and superconducting X-ray...
- Publication number 20050184238
- Publication date Aug 25, 2005
- Akikazu Odawara
- G01 - MEASURING TESTING
Information Patent Application
Cooling apparatus and SQUID microscope using same
- Publication number 20030172660
- Publication date Sep 18, 2003
- Akikazu Odawara
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Application
Superconductive quantum interference element
- Publication number 20020097047
- Publication date Jul 25, 2002
- Akikazu Odawara
- G01 - MEASURING TESTING
Information Patent Application
Cooling apparatus
- Publication number 20010023592
- Publication date Sep 27, 2001
- Akikazu Odawara
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS

Akikazu Odawara

Person

Patents Grantslast 30 patents

X-ray fluorescence analysis apparatus

Radiation analyzer and method for analyzing radiation

X-ray analyzer

Superconducting radiometry apparatus

Superconducting X-ray detector and X-ray analysis apparatus using t...

Superconducting X-ray detection apparatus and superconducting X-ray...

Cooling apparatus and squid microscope using same

Superconductive quantum interference element

Cooling apparatus

Superconducting quantum interference device

Nondestructive method of quantitatively evaluating degree of plasti...

Superconducting quantum interference device and non-destructive eva...

Method of detecting plastic deformation in steel using a differenti...

Superconducting quantum interference device fluxmeter and nondestru...

Nondestructive inspection apparatus with superconducting magnetic s...

Nondestructive testing system using a SQUID

Magnetic field detection coils with superconducting wiring pattern...

Apparatus for detecting a fine magnetic field with characteristic t...

Apparatus for detecting a fine magnetic field with a signal adjusti...

Patents Applicationslast 30 patents

X-RAY FLUORESCENCE ANALYSIS APPARATUS

RADIATION ANALYZER AND METHOD FOR ANALYZING RADIATION

Superconducting radiometry apparatus

X-RAY ANALYZER

Superconducting X-Ray Detector And X-Ray Analysis Apparatus Using T...

Three-dimensional structure analyzing system

Superconducting X-ray detection apparatus and superconducting X-ray...

Cooling apparatus and SQUID microscope using same

Superconductive quantum interference element

Cooling apparatus