Akiko FUJISAWA

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for observing sample and electronic microscope
- Patent number 9,013,572
- Issue date Apr 21, 2015
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 8,288,725
- Issue date Oct 16, 2012
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 8,212,224
- Issue date Jul 3, 2012
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 7,838,829
- Issue date Nov 23, 2010
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE
- Publication number 20150185455
- Publication date Jul 2, 2015
- Hitachi High-Technologies Corporation
- Akiko FUJISAWA
- G02 - OPTICS
Information Patent Application
METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE
- Publication number 20110205353
- Publication date Aug 25, 2011
- Akiko Fujisawa
- G02 - OPTICS
Information Patent Application
Charged Particle Beam Device
- Publication number 20110062327
- Publication date Mar 17, 2011
- Hitachi High-Technologies Corporation
- Akiko FUJISAWA
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20090218507
- Publication date Sep 3, 2009
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20080224037
- Publication date Sep 18, 2008
- Hitachi High-Technologies Corporation
- Akiko FUJISAWA
- G01 - MEASURING TESTING