Akiko HISADA

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Patents Grantslast 30 patents

Information Patent Grant
Cell analysis apparatus and cell analysis method
- Patent number 12,146,846
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko Hisada
- G01 - MEASURING TESTING
Information Patent Grant
Observation support unit for charged particle microscope and sample...
- Patent number 10,431,416
- Issue date Oct 1, 2019
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,134,564
- Issue date Nov 20, 2018
- Hitachi High-Technologies Corporation
- Taiga Okumura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Particle Analysis Device and Particle Analysis Method
- Publication number 20240219286
- Publication date Jul 4, 2024
- Hitachi High-Tech Corporation
- Erino MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE ANALYZING DEVICE, AND PARTICLE ANALYZING METHOD
- Publication number 20240201113
- Publication date Jun 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko HISADA
- G01 - MEASURING TESTING
Information Patent Application
CELL ANALYSIS APPARATUS AND CELL ANALYSIS METHOD
- Publication number 20210181127
- Publication date Jun 17, 2021
- HITACHI HIGH-TECH CORPORATION
- Akiko HISADA
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION SUPPORT UNIT FOR CHARGED PARTICLE MICROSCOPE AND SAMPLE...
- Publication number 20190013177
- Publication date Jan 10, 2019
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20170330724
- Publication date Nov 16, 2017
- Hitachi High-Technologies Corporation
- Taiga OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS