Akiko Yokokawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis apparatus and sample measuring method
- Patent number 10,168,345
- Issue date Jan 1, 2019
- Hitachi High-Technologies Corporation
- Akiko Yokokawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automatic Analysis Apparatus and Sample Measuring Method
- Publication number 20150160251
- Publication date Jun 11, 2015
- Hitachi High-Technologies Corporation
- Akiko Yokokawa
- G01 - MEASURING TESTING