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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Substance analyzer and substance analysis method
Patent number
11,776,800
Issue date
Oct 3, 2023
HITACHI HIGH-TECH CORPORATION
Yasuaki Takada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microscope observation container and observation device
Patent number
9,971,139
Issue date
May 15, 2018
Hitachi High-Technologies Corporation
Michiru Fujioka
G02 - OPTICS
Information
Patent Grant
Heat retaining device
Patent number
8,709,364
Issue date
Apr 29, 2014
Hitachi High-Technologies Corporation
Akimasa Osaka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Cooling Box and Analysis Device
Publication number
20230304728
Publication date
Sep 28, 2023
Hitachi High-Tech Corporation
Kazutoshi ONUKI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE-ANALYZING APPARATUS
Publication number
20220412848
Publication date
Dec 29, 2022
Hitachi High-Tech Corporation
Akimasa Osaka
G01 - MEASURING TESTING
Information
Patent Application
SUBSTANCE ANALYZER AND SUBSTANCE ANALYSIS METHOD
Publication number
20220359182
Publication date
Nov 10, 2022
HITACHI HIGH-TECH CORPORATION
Yasuaki TAKADA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Microscope Observation Container and Observation Device
Publication number
20170045726
Publication date
Feb 16, 2017
Hitachi High-Technologies Corporation
Michiru FUJIOKA
G02 - OPTICS
Information
Patent Application
HEAT INSULATOR
Publication number
20120207646
Publication date
Aug 16, 2012
Hitachi High-Technologies Corporation
Akimasa Osaka
G01 - MEASURING TESTING